SPRADI6 May   2024 F29H850TU , F29H859TU-Q1 , TMS320F2800132 , TMS320F2800133 , TMS320F2800135 , TMS320F2800137 , TMS320F2800152-Q1 , TMS320F2800153-Q1 , TMS320F2800154-Q1 , TMS320F2800155 , TMS320F2800155-Q1 , TMS320F2800156-Q1 , TMS320F2800157 , TMS320F2800157-Q1 , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Overview of C2000™ MCU Devices in Appliances
  6. 3Introduction of IEC/UL 60730-1/60335-1 Standards
  7. 4Diagnostic Libraries for UL/IEC 60730-1/60335-1 Provided by C2000™
    1. 4.1 Stack Overflow Detection
    2. 4.2 Watchdog
    3. 4.3 CPU and FPU Registers
    4. 4.4 Program Counter (PC)
    5. 4.5 Clock
    6. 4.6 RAM
    7. 4.7 Flash
    8. 4.8 ADC
    9. 4.9 Cycle Time and Memory Usage
  8. 5References

ADC

In addition, for UL/IEC 60730-1/60335-1 certification, the ADC module usually needs to be self-tested. An external voltage reference chip like the TLV431 can be added to the peripheral of the C2000 MCU connected to the AD port. A single C2000 integrated circuit usually contains multiple ADC modules, and each ADC module needs to be verified. Therefore, the AD port connected to the voltage reference chip is usually able to be sampled by any ADC module. This signal is sampled during power-on self-checking and periodic self-checking, and is considered passed if the signal falls within a certain deviation range.