The key functions of the trip-zone submodule are:
- Trip inputs
TZ1 to
TZ6 can be flexibly mapped to any ePWM module.
- Upon a fault condition, outputs EPWMxA and EPWMxB can be forced to one of the following:
- High
- Low
- High-impedance
- No action taken
- Support for one-shot trip (OSHT) for major short circuits or over-current conditions.
- Support for cycle-by-cycle tripping (CBC) for current limiting operation.
- Support for digital compare tripping (DC) based
on state of on-chip analog comparator module outputs and
TZ1 to TZ3 signals.
- Each trip-zone input and digital compare (DC) submodule DCAEVT1/2 or DCBEVT1/2 force event can be allocated to either one-shot or cycle-by-cycle operation.
- Interrupt generation is possible on any trip-zone input.
- Software-forced tripping is also supported.
- The trip-zone submodule can be fully bypassed if the submodule is not
required.