Instantiated in the device are various internal diagnostics modules which provide on-chip monitoring and diagnostic functions required to achieve certain safety compliance levels:
- Four Dual Clock Comparator (DCC) modules, used to determine the accuracy of a clock signal during the time execution of an application, each having the following main features:
- Two independent counter blocks count clock pulses from each clock source
- Each counter block is programmable, however, for proper operation the counters must be programmed with seed values that respect the ratio of the two clock frequencies
- Configurable time base for error signal
- Error signal generation when one of the clocks is out of spec
- Clock frequency measurement
- One Memory Cyclic Redundancy Check (MCRC) module to enable hardware-based CRC calculations.
- Integrated on-die temperature monitor (+/- 8º C temperature accuracy)
- One instance of Error Signaling Module (ESM) for safety-related events and/or errors aggregation from throughout the device into one location supports the following main features:
- Up to 1024 level or pulse error event inputs
- Selectable low and
high priority interrupt, error pin prioritization of each error
event
- Error signal routed out of device through MCU_ESM error signal
- Configurable time base for error signal
- Error forcing capability
- Internal redundant flops on safety critical fields
- Multiple ECC Aggregator modules supporting ECC mechanism for providing increased system reliability via reduction of memory software errors by allowing single bit errors to be detected and corrected (SEC) and double bit errors to be detected (DED). Applied to different memories in many of the subsystems, each of the ECC aggregators has the following main features:
- Reduces memory software errors via single error correction (SEC) and double error detection (DED)
- Provides a mechanism to control and monitor the ECC RAMs in a module or subsystem
- Aggregates level pending status from the ECC RAMs in two interrupts to the device CPU – interrupt for correctable error (SEC) and interrupt for uncorrectable error (DED)
- Supports up to 256 ECC endpoints (either ECC RAM or interconnect ECC component)