SPRUJ17H March 2022 – October 2024 AM2631 , AM2631-Q1 , AM2632 , AM2632-Q1 , AM2634 , AM2634-Q1
Signal Name | I/O Type | Description |
---|---|---|
TCK | I |
Test Clock. Controls the timing of the test interface independently from any system clocks. TCK is pulsed by the equipment controlling the test and not by the tested device. |
TMS | I |
Test Mode Select. Controls the transitions of the test interface state machine |
TDI | I |
Test Data Input. Supplies the data to the JTAG registers |
TDO | O/Z |
Test Data Output. Used to serially output the data from the JTAG registers to the equipment controlling the test. |