SPRZ375L October 2012 – June 2020 F28M36H33B2 , F28M36H53B2 , F28M36P53C2 , F28M36P63C2
Usage notes highlight and describe particular situations where the device's behavior may not match presumed or documented behavior. This may include behaviors that affect device performance or functional correctness. These usage notes will be incorporated into future documentation updates for the device (such as the device-specific data sheet), and the behaviors they describe will not be altered in future silicon revisions.
Table 2 shows which silicon revision(s) are affected by each usage note.
TITLE | SILICON REVISION(S) AFFECTED | ||||
---|---|---|---|---|---|
0 | A | B | E | F | |
PIE: Spurious Nested Interrupt After Back-to-Back PIEACK Write and Manual CPU Interrupt Mask Clear | Yes | Yes | Yes | Yes | Yes |
FPU32 and VCU Back-to-Back Memory Accesses | Yes | Yes | Yes | Yes | Yes |
Caution While Using Nested Interrupts | Yes | Yes | Yes | Yes | Yes |
PBIST: PBIST Memory Test Feature is Deprecated | Yes | Yes | Yes | Yes | Yes |
HWBIST: Cortex-M3 HWBIST Feature is Deprecated | Yes | Yes | Yes | Yes | Yes |
HWBIST: C28x HWBIST Feature Support is Restricted to TI-Supplied Software | Yes | Yes | Yes | Yes | Yes |
Flash Tools: Device Revision Requires a Flash Tools Update | Yes | Yes | Yes | Yes | Yes |
EPI: New Feature Addition to EPI Module | Yes | Yes | Yes | Yes | |
EPI: ALE Signal Polarity | Yes | Yes | Yes | Yes | |
EPI: CS0/CS1 Swap | Yes | Yes | Yes | Yes |