This user's guide describes the characteristics, operation, and use of the LM2105 Evaluation Module (EVM). A complete schematic diagram, PCB layouts, and BOM are included in this document.
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The LM2105 is designed to primarily evaluate the LM2105 performance. This driver is a 105-V boot voltage, high-side, low-side driver with 0.5-A peak source and 0.8-A sink current for driving two N-channel MOSFETs. The same board can be used to evaluate other pin-to-pin compatible parts in the supported package. The LM2105 has low propagation delay and low propagation delay matching between the high- and low-side rising and falling edges of the driver outputs for reliable timing of the gate-drive signals.
The EVM is developed in such a way that the LM2105 driver performance can be evaluated and compared to data sheet parameters, or externally connected to power devices with provisions for source and sink gate-resistance flexibility. The LM2105 evaluation board uses surface-mount test points allowing connection to INL, INH, GVDD, and BST inputs. A variety of other test points are available for probing the LM2105. The input bias is configured such that the BST-SH high-side bias can be sourced from GVDD, or an external additional bias can be added to provide BST-SH directly. The high- and low-side driver output returns are separated on SH and GND respectively to allow evaluation of the LM2105 SH negative voltage capabilities.