SNVA967C June 2020 – April 2021 LM34966-Q1 , LM5156 , LM5156-Q1 , LM51561 , LM51561-Q1 , LM51561H , LM51561H-Q1 , LM5156H , LM5156H-Q1
This document contains information for LM5156, LM5156-Q1, LM51561, LM51561-Q1 (WSON), LM5156H, LM5156H-Q1, LM51561H, LM51561H-Q1, and LM34966-Q1 (HTSSOP) to aid in a functional safety system design. Information provided are:
Figure 1-1 and Figure 1-2 show the device functional block diagrams for reference.
The LM5156, LM5156-Q1, LM51561, LM51561-Q1, LM5156H, LM5156H-Q1, LM51561H, LM51561H-Q1, and LM34966-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for LM5156, LM5156-Q1, LM51561, LM51561-Q1 (package of WSON) based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 6 |
Die FIT Rate | 3 |
Package FIT Rate | 3 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog & Mixed HV >50V supply | 30 FIT | 75°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
This section provides Functional Safety Failure In Time (FIT) rates for LM5156H, LM5156H-Q1, LM51561H, LM51561H-Q1, and LM34966-Q1 (package of HTSSOP) based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 12 |
Die FIT Rate | 4 |
Package FIT Rate | 8 |
The failure rate and mission profile information in Table 3-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog & Mixed HV >50V supply | 30 FIT | 75°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 3-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.