Series Resistors, So No External Resistors Are RequiredSCOPE, Widebus, UBT, and EPIC-IIB are trademarks of Texas Instruments Incorporated.
The 'ABTH18502A and 'ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.
Data flow in each direction is controlled by output-enable (
and 
), latch-enable (LEAB and LEBA),
and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device
operates in the transparent mode when LEAB is high. When LEAB is low,
the A-bus data is latched while CLKAB is held at a static low or high
logic level. Otherwise, if LEAB is low, A-bus data is stored on a
low-to-high transition of CLKAB. When is low, the B outputs are active.
When is high, the B
outputs are in the high-impedance state. B-to-A data flow is similar
to A-to-B data flow but uses the , LEBA, and CLKBA inputs.
In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
The B-port outputs of 'ABTH182502A, which are designed to source
or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
The SN54ABTH18502A and SN54ABTH182502A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18502A and SN74ABTH182502A are characterized for operation from -40°C to 85°C.
A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, and CLKBA.
Output level before the indicated steady-state input conditions were established
For additional terms or required resources, click any title below to view the detail page where available.
| Package | Pins | CAD symbols, footprints & 3D models |
|---|---|---|
| LQFP (PM) | 64 | Ultra Librarian |
Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.
If you have questions about quality, packaging or ordering TI products, see TI support.