Inicio Interfaz Transceptores RS-485 y RS-422

AM26C32-EP

ACTIVO

Receptor de línea diferencial cuádruple de producto mejorado

Detalles del producto

Number of receivers 4 Number of transmitters 0 Duplex Half Supply voltage (nom) (V) 5 Signaling rate (max) (Mbps) 10 IEC 61000-4-2 contact (±V) None Fault protection (V) -11 to 14 Common-mode range (V) -7 to 7 Number of nodes 32 Isolated No Supply current (max) (µA) 15000 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Number of receivers 4 Number of transmitters 0 Duplex Half Supply voltage (nom) (V) 5 Signaling rate (max) (Mbps) 10 IEC 61000-4-2 contact (±V) None Fault protection (V) -11 to 14 Common-mode range (V) -7 to 7 Number of nodes 32 Isolated No Supply current (max) (µA) 15000 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 16 59.4 mm² 9.9 x 6
  • Controlled Baseline
    • One Assembly
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Meets or Exceeds the Requirements of ANSI TIA/EIA-422-B, TIA/EIA-423-B, and ITU Recommendation V.10 and V.11
  • Low Power, ICC = 10 mA Typ
  • ±7 V Common-Mode Range With ±200 mV Sensitivity
  • Input Hysteresis . . . 60 mV Typ
  • tpd = 17 ns Typ
  • Operates From a Single 5 V Supply
  • 3-State Outputs
  • Input Fail-Safe Circuitry
  • Improved Replacements for AM26LS32

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

  • Controlled Baseline
    • One Assembly
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Meets or Exceeds the Requirements of ANSI TIA/EIA-422-B, TIA/EIA-423-B, and ITU Recommendation V.10 and V.11
  • Low Power, ICC = 10 mA Typ
  • ±7 V Common-Mode Range With ±200 mV Sensitivity
  • Input Hysteresis . . . 60 mV Typ
  • tpd = 17 ns Typ
  • Operates From a Single 5 V Supply
  • 3-State Outputs
  • Input Fail-Safe Circuitry
  • Improved Replacements for AM26LS32

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The AM26C32 is a quadruple differential line receiver for balanced or unbalanced digital data transmission. The enable function is common to all four receivers and offers a choice of active-high or active-low input. The 3-state outputs permit connection directly to a bus-organized system. Fail-safe design specifies that if the inputs are open, the outputs always are high.

The AM26C32 devices are manufactured using a BiCMOS process, which is a combination of bipolar and CMOS transistors. This process provides the high voltage and current of bipolar with the low power of CMOS to reduce the power consumption to about one-fifth that of the standard AM26LS32, while maintaining ac and dc performance.

The AM26C32 is characterized for operation over the extended temperature range of -55°C to 125°C.

The AM26C32 is a quadruple differential line receiver for balanced or unbalanced digital data transmission. The enable function is common to all four receivers and offers a choice of active-high or active-low input. The 3-state outputs permit connection directly to a bus-organized system. Fail-safe design specifies that if the inputs are open, the outputs always are high.

The AM26C32 devices are manufactured using a BiCMOS process, which is a combination of bipolar and CMOS transistors. This process provides the high voltage and current of bipolar with the low power of CMOS to reduce the power consumption to about one-fifth that of the standard AM26LS32, while maintaining ac and dc performance.

The AM26C32 is characterized for operation over the extended temperature range of -55°C to 125°C.

Descargar Ver vídeo con transcripción Video

Productos similares que pueden interesarle

open-in-new Comparar alternativas
Funcionalidad similar a la del dispositivo comparado
AM26C32 ACTIVO Receptor de línea diferencial cuádruple Catalog version

Documentación técnica

star =Principal documentación para este producto seleccionada por TI
No se encontraron resultados. Borre su búsqueda y vuelva a intentarlo.
Ver todo 4
Tipo Título Fecha
* Data sheet Quadruple Differential Line Receiver datasheet 01 nov 2007
* VID AM26C32-EP VID V6207648 21 jun 2016
* Radiation & reliability report AM26C32MDREP Reliability Report 25 ago 2011
Application note Debugging Sitara AM2x Microcontrollers PDF | HTML 24 oct 2022

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
Guía del usuario: PDF
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SOIC (D) 16 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Los productos recomendados pueden tener parámetros, módulos de evaluación o diseños de referencia relacionados con este producto de TI.

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

Si tiene preguntas sobre la calidad, el paquete o el pedido de productos de TI, consulte el soporte de TI. ​​​​​​​​​​​​​​

Videos