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SN54SC8T573-SEP

Name: SN54SC8T573-SEP
Brand: TI
SKU: SN54SC8T573-SEP
Price: 150 USD

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Hoja de datos

document-pdfAcrobat SN54SC8T573-SEP Radiation Tolerant Octal Transparent D-Type Latches with 3-State Outputs datasheet (Inglés) PDF | HTML

Detalles del producto

Technology family

SCxT

Number of channels

8

IOH (max) (mA)

-25

IOL (max) (mA)

25

Features

Balanced outputs, Over-voltage tolerant inputs, Voltage translation

Input type

TTL-Compatible CMOS

Output type

3-State

Operating temperature range (°C)

-55 to 125

Technology family

SCxT

Number of channels

8

IOH (max) (mA)

-25

IOL (max) (mA)

25

Features

Balanced outputs, Over-voltage tolerant inputs, Voltage translation

Input type

TTL-Compatible CMOS

Output type

3-State

Operating temperature range (°C)

-55 to 125

TSSOP (PW)

20

41.6 mm² 6.5 x 6.4

Vendor item drawing available, VID V62/25628-01XE
Radiation - Total Ionizing Dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - Single-Event Effects (SEE):
- Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range of 1.2V to 5.5V
Single-supply voltage translator:
- Up translation:
  - 1.2V to 1.8V
  - 1.5V to 2.5V
  - 1.8V to 3.3V
  - 3.3V to 5.0V
- Down translation:
  - 5.0V, 3.3V, 2.5V to 1.8V
  - 5.0V, 3.3V to 2.5V
  - 5.0V to 3.3V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 250mA per JESD 17
Space enhanced plastic:
- Supports defense and aerospace applications
- Controlled baseline
- Au bondwire and NiPdAu lead finish
- Meets NASA ASTM E595 outgassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

Vendor item drawing available, VID V62/25628-01XE
Radiation - Total Ionizing Dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
Radiation - Single-Event Effects (SEE):
- Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
Wide operating range of 1.2V to 5.5V
Single-supply voltage translator:
- Up translation:
  - 1.2V to 1.8V
  - 1.5V to 2.5V
  - 1.8V to 3.3V
  - 3.3V to 5.0V
- Down translation:
  - 5.0V, 3.3V, 2.5V to 1.8V
  - 5.0V, 3.3V to 2.5V
  - 5.0V to 3.3V
5.5V tolerant input pins
Supports standard pinouts
Up to 150Mbps with 5V or 3.3V VCC
Latch-up performance exceeds 250mA per JESD 17
Space enhanced plastic:
- Supports defense and aerospace applications
- Controlled baseline
- Au bondwire and NiPdAu lead finish
- Meets NASA ASTM E595 outgassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability

The SN54SC8T573-SEP devices are octal transparent D-type latches that feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

While the latch-enable (LE) input is high, the Q outputs respond to the data (D) inputs. When LE is low, the outputs are latched to retain the data that was set up.

The SN54SC8T573-SEP devices are octal transparent D-type latches that feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

While the latch-enable (LE) input is high, the Q outputs respond to the data (D) inputs. When LE is low, the outputs are latched to retain the data that was set up.

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Documentación técnica

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Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Encapsulado	Pines	Símbolos CAD, huellas y modelos 3D
TSSOP (PW)	20	Ultra Librarian

Se aplican los Términos y condiciones estándar de TI para los elementos de evaluación.

	Tipo	Título		Fecha
*	Data sheet	SN54SC8T573-SEP Radiation Tolerant Octal Transparent D-Type Latches with 3-State Outputs datasheet	PDF \| HTML	26 ene 2025
*	Radiation & reliability report	SN54SC8T573-SEP Production Flow and Reliability Report	PDF \| HTML	21 feb 2025
*	Radiation & reliability report	SN54SC8T573-SEP Single-Event Effects (SEE) Radiation Report	PDF \| HTML	20 feb 2025
*	Radiation & reliability report	SN54SC8T573-SEP Total Ionizing Dose (TID) Report		20 feb 2025

SN54SC8T573-SEP

Cierres octales de tipo D de producto mejorado con palanca de cambios de nivel lógico

SN54SC8T573-SEP

Detalles del producto

Documentación técnica

Diseño y desarrollo

Pedidos y calidad

Soporte y capacitación

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