Inicio Lógica y traducción de voltaje Biestables, latches y registros Conversión de tensión de circuitos biestables, bloqueos y registros

SN74LV2T74-Q1

ACTIVO

Biestables de tipo D con activación de borde positivo doble de 1.8 V a 5.5 V con fuente de alimentac

Detalles del producto

Technology family LV1T Number of channels 2 Vout (min) (V) 1.65 Vout (max) (V) 5.5 Data rate (max) (Mbps) 150 IOH (max) (mA) -8 IOL (max) (mA) 8 Supply current (max) (µA) 20 Features Balanced outputs, Over-voltage tolerant inputs, Voltage translation Input type Standard CMOS, TTL-Compatible CMOS Output type Push-Pull Operating temperature range (°C) -40 to 125
Technology family LV1T Number of channels 2 Vout (min) (V) 1.65 Vout (max) (V) 5.5 Data rate (max) (Mbps) 150 IOH (max) (mA) -8 IOL (max) (mA) 8 Supply current (max) (µA) 20 Features Balanced outputs, Over-voltage tolerant inputs, Voltage translation Input type Standard CMOS, TTL-Compatible CMOS Output type Push-Pull Operating temperature range (°C) -40 to 125
TSSOP (PW) 14 32 mm² 5 x 6.4 WQFN (BQA) 14 7.5 mm² 3 x 2.5
  • AEC-Q100 qualified for automotive applications:

    • Device temperature grade 1: -40°C to +125°C
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B
  • Available in wettable flank QFN (WBQA) package

  • Wide operating range of 1.8 V to 5.5 V
  • Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):

    • Up translation:

      • 1.2 V to 1.8 V
      • 1.5 V to 2.5 V
      • 1.8 V to 3.3 V
      • 3.3 V to 5.0 V
    • Down translation:
      • 5.0 V, 3.3 V, 2.5 V to 1.8 V
      • 5.0 V, 3.3 V to 2.5 V
      • 5.0 V to 3.3 V
  • 5.5-V tolerant input pins
  • Supports standard pinouts
  • Up to 150 Mbps with 5-V or 3.3-V V CC
  • Latch-up performance exceeds 250 mA per JESD 17
  • AEC-Q100 qualified for automotive applications:

    • Device temperature grade 1: -40°C to +125°C
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B
  • Available in wettable flank QFN (WBQA) package

  • Wide operating range of 1.8 V to 5.5 V
  • Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):

    • Up translation:

      • 1.2 V to 1.8 V
      • 1.5 V to 2.5 V
      • 1.8 V to 3.3 V
      • 3.3 V to 5.0 V
    • Down translation:
      • 5.0 V, 3.3 V, 2.5 V to 1.8 V
      • 5.0 V, 3.3 V to 2.5 V
      • 5.0 V to 3.3 V
  • 5.5-V tolerant input pins
  • Supports standard pinouts
  • Up to 150 Mbps with 5-V or 3.3-V V CC
  • Latch-up performance exceeds 250 mA per JESD 17

The SN74LV2T74-Q1 contains two independent D-type positive-edge-triggered flip-flops. A low level at the preset ( PRE) input sets the output high. A low level at the clear ( CLR) input resets the output low. Preset and clear functions are asynchronous and not dependent on the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs (Q, Q) on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the input clock (CLK) signal. Following the hold-time interval, data at the data (D) input can be changed without affecting the levels at the outputs (Q, Q). The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).

The SN74LV2T74-Q1 contains two independent D-type positive-edge-triggered flip-flops. A low level at the preset ( PRE) input sets the output high. A low level at the clear ( CLR) input resets the output low. Preset and clear functions are asynchronous and not dependent on the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs (Q, Q) on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the input clock (CLK) signal. Following the hold-time interval, data at the data (D) input can be changed without affecting the levels at the outputs (Q, Q). The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).

Descargar Ver vídeo con transcripción Video

Documentación técnica

star =Principal documentación para este producto seleccionada por TI
No se encontraron resultados. Borre su búsqueda y vuelva a intentarlo.
Ver todo 1
Tipo Título Fecha
* Data sheet SN74LV2T74-Q1 Automotive Dual D-Type Flip-Flop With Integrated Translation datasheet PDF | HTML 24 may 2023

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

14-24-LOGIC-EVM — Módulo de evaluación genérico de productos lógicos para encapsulados D, DB, DGV, DW, DYY, NS y PW de

El módulo de evaluación 14-24-LOGIC-EVM (EVM) está diseñado para admitir cualquier dispositivo lógico que esté en un encapsulado D, DW, DB, NS, PW, DYY o DGV de 14 a 24 pines.

Guía del usuario: PDF | HTML
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
TSSOP (PW) 14 Ultra Librarian
WQFN (BQA) 14 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

Si tiene preguntas sobre la calidad, el paquete o el pedido de productos de TI, consulte el soporte de TI. ​​​​​​​​​​​​​​

Videos