홈 로직 및 전압 변환 플립플롭, 래치 및 레지스터 시프트 레지스터
홈
로직 및 전압 변환
플립플롭, 래치 및 레지스터
시프트 레지스터

CD4015B

활성

CMOS 듀얼 4단계 정적 시프트 레지스터

지금 주문
데이터 시트

CD4015B

활성
데이터 시트 지금 주문

제품 상세 정보

Configuration Serial-in, Parallel-out Bits (#) 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 8.5 IOL (max) (mA) 4.2 IOH (max) (mA) -4.2 Supply current (max) (µA) 3000 Features Balanced outputs, Positive input clamp diode, Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
Configuration Serial-in, Parallel-out Bits (#) 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 8.5 IOL (max) (mA) 4.2 IOH (max) (mA) -4.2 Supply current (max) (µA) 3000 Features Balanced outputs, Positive input clamp diode, Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOIC (D) 16 59.4 mm² 9.9 x 6 TSSOP (PW) 16 32 mm² 5 x 6.4
  • Medium speed operation...12 MHz (typ.) clock rate at VDD – VSS = 10 V
  • Fully static operation
  • 8 master-slave flip-flops plus input and output buffering
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Standardized, symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
    • 1 V at VDD = 5 V
    • 2 V at VDD = 10 V
    • 2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Serial-input/parallel-output data queueing
    • Serial to parallel data conversion
    • General-purpose register

Data sheet acquired from Harris Semiconductor
  • Medium speed operation...12 MHz (typ.) clock rate at VDD – VSS = 10 V
  • Fully static operation
  • 8 master-slave flip-flops plus input and output buffering
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Standardized, symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
    • 1 V at VDD = 5 V
    • 2 V at VDD = 10 V
    • 2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Serial-input/parallel-output data queueing
    • Serial to parallel data conversion
    • General-purpose register

Data sheet acquired from Harris Semiconductor

CD4015B consists of two identical, independent, 4-stage serial-input/parallel-output registers. Each register has independent CLOCK and RESET inputs as well as a single serial DATA input. "Q" outputs are available from each of the four stages on both registers. All register stages are D-type, master-slave flip-flops. The logic level present at the DATA input is transferred into the first register stage and shifted over one stage at each positive-going clock transition. Resetting of all stages is accomplished by a high level on the reset line. Register expansion to 8 stages using one CD4015B package, or to more than 8 stages using additional CD4015B’s is possible.

The CD4015B-series types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic package (E suffix), 16-lead small-outline packages (M, M96, MT, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4015B consists of two identical, independent, 4-stage serial-input/parallel-output registers. Each register has independent CLOCK and RESET inputs as well as a single serial DATA input. "Q" outputs are available from each of the four stages on both registers. All register stages are D-type, master-slave flip-flops. The logic level present at the DATA input is transferred into the first register stage and shifted over one stage at each positive-going clock transition. Resetting of all stages is accomplished by a high level on the reset line. Register expansion to 8 stages using one CD4015B package, or to more than 8 stages using additional CD4015B’s is possible.

The CD4015B-series types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic package (E suffix), 16-lead small-outline packages (M, M96, MT, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).
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관심 가지실만한 유사 제품

open-in-new 대안 비교
비교 대상 장치와 유사한 기능
CD74HC194 활성 고속 CMOS 로직 4비트 양방향 범용 시프트 레지스터 Voltage range (2V to 6V), average drive strength (8mA), average propagation delay (20ns)

기술 자료

star =TI에서 선정한 이 제품의 인기 문서
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8개 모두 보기
유형 직함 날짜
* Data sheet CD4015B Types datasheet (Rev. D) 2003/10/14
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 2022/12/15
Selection guide Logic Guide (Rev. AB) 2017/06/12
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015/12/02
User guide LOGIC Pocket Data Book (Rev. B) 2007/01/16
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004/07/08
User guide Signal Switch Data Book (Rev. A) 2003/11/14
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001/12/03

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

평가 보드

14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈

14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.

사용 설명서: PDF | HTML
TI.com에서 구매 불가
패키지 핀 CAD 기호, 풋프린트 및 3D 모델
PDIP (N) 16 Ultra Librarian
SOIC (D) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian
TI의 평가 항목에 대한 표준 약관이 적용됩니다.

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

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포럼 주제 모두 보기(영문)

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