SN74LV2T74
- Wide operating range of 1.8 V to 5.5 V
-
Single-supply voltage translator (refer to LVxT Enhanced Input Voltage):
-
Up translation:
- 1.2 V to 1.8 V
- 1.5 V to 2.5 V
- 1.8 V to 3.3 V
- 3.3 V to 5.0 V
- Down translation:
- 5.0 V, 3.3 V, 2.5 V to 1.8 V
- 5.0 V, 3.3 V to 2.5 V
- 5.0 V to 3.3 V
-
- 5.5-V tolerant input pins
- Supports standard pinouts
- Up to 150 Mbps with 5-V or 3.3-V V CC
- Latch-up performance exceeds 250 mA per JESD 17
The SN74LV2T74 contains two independent D-type positive-edge-triggered flip-flops. A low level at the preset ( PRE) input sets the output high. A low level at the clear ( CLR) input resets the output low. Preset and clear functions are asynchronous and not dependent on the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs (Q, Q) on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the input clock (CLK) signal. Following the hold-time interval, data at the data (D) input can be changed without affecting the levels at the outputs (Q, Q). The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).
기술 자료
설계 및 개발
추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.
14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈
14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.
패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
---|---|---|
TSSOP (PW) | 14 | Ultra Librarian |
WQFN (BQA) | 14 | Ultra Librarian |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치