SN74LVC1G80-Q1
- Qualified for Automotive Applications
- AEC-Q100 Qualified With the Following Results:
- ±4000-V Human-Body Model (HBM) ESD Classification Level 3A
- ±1000-V Charged-Device Model (CDM) ESD Classification Level C5
- Supports 5-V VCC Operation
- Inputs Accept Voltages to 5.5 V
- Supports Down Translation to VCC
- Maximum tpd of 6 ns at 3.3 V
- Low Power Consumption, 10-µA Max ICC
- ±24-mA Output Drive at 3.3 V
- Ioff supports Partial-Power-Down Mode and Back-Drive Protection
The SN74LVC1G80-Q1 device is an automotive AEC-Q100 qualified, single positive-edge-triggered D-type flip-flop that is designed for 1.65-V to 5.5-V VCC operation.
When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the level at the output.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs when the device is powered down. This inhibits current backflow into the device which prevents damage to the device.
기술 자료
설계 및 개발
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5-8-LOGIC-EVM — 5핀~8핀 DCK, DCT, DCU, DRL 및 DBV 패키지용 일반 논리 평가 모듈
패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
---|---|---|
SOT-SC70 (DCK) | 5 | Ultra Librarian |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치