BUF08821
- 10-BIT RESOLUTION
- 8-CHANNEL P-GAMMA
- 1-CHANNEL P-VCOM
- 16x REWRITABLE NONVOLATILE MEMORY
- TWO INDEPENDENT PIN-SELECTABLE MEMORY BANKS
- RAIL-TO-RAIL OUTPUT:
300mV Minimum Swing-to-Rail (10mA)
> 300mA Maximum IOUT - LOW SUPPLY CURRENT
- SUPPLY VOLTAGE: 9V to 20V
- DIGITAL SUPPLY: 2V to 5.5V
- I2C INTERFACE: Supports 400kHz and 3.4MHz Clock Frequency
- APPLICATIONS
- TFT-LCD REFERENCE DRIVERS
The BUF08821 offers eight programmable gamma channels plus one programmable VCOM channel.
The final gamma and VCOM values can be stored in the on-chip, nonvolatile memory. To allow for programming errors or liquid crystal display (LCD) panel rework, the BUF08821 supports up to 16 write operations to the on-chip memory.
The BUF08821 has two separate memory banks, allowing simultaneous storage of two different gamma curves to facilitate switching between gamma curves.
All gamma and VCOM channels offer a rail-to-rail output that typically swings to within 150mV of either supply rail with a 10mA load. All channels are programmed using an I2C interface that supports standard operations up to 400kHz and high-speed data transfers up to 3.4MHz.
The BUF08821 is manufactured using Texas Instruments’ proprietary, state-of-the-art, high-voltage CMOS process. This process offers very dense logic and HIGH supply voltage operation of up to 20V. The BUF08821 is offered in a HTSSOP-20 PowerPAD package. It is specified from –40°C to +85°C.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | Prog. Gamma-Voltage Generator & Vcom Calibrator w/ Integrated 2-Bank Memory datasheet (Rev. D) | 2011年 7月 12日 | |
EVM User's guide | BUF08821EVM-USB User's Guide (Rev. A) | 2016年 8月 2日 | ||
Application note | Driving Capacitive Loads with Gamma Buffers | 2012年 11月 20日 | ||
EVM User's guide | BUF08821EVM User's Guide | 2008年 9月 24日 |
設計與開發
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PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
HTSSOP (PWP) | 20 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點