LMG2640EVM-090

LMG2640 daughter card

LMG2640EVM-090

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Overview

The LMG2640 daughter card evaluation module (EVM) is designed to provide a quick and easy platform to evaluate TI's integrated GaN devices in any half-bridge topology. The board is designed to be interfaced with a larger system using the six power pins and 10 digital pins on the bottom edge of the board. Power pins form the main switching loop consisting of a high voltage DC bus, switch node and power ground. The digital pins control the LMG2640 device with PWM gate inputs, provide auxiliary power with low voltage supplies and report faults as a digital output. Evaluating the LMG2640EVM's performance is most easily demonstrated using a synchronous buck/boost motherboard from TI (LMG342X-BB-EVM). The daughtercard easily plugs into the motherboard and interfaces all power and digital control in an open-loop configuration for full system control. Additionally, a recommended footprint is provided to interface the daughtercard with a custom system for further testing.

Features
  • Input voltage operation up to 650V
  • Simple open loop design to evaluate performance of LMG2640
  • Single/Dual PWM input on board for PWM signal with variable dead time
  • Highly-integrated GaN power-FET half bridge with low-side current sense emulation output
  • Convenient probe points for logic and power stage measurements with oscilloscope probes having short ground spring probes

  • General Texas Instruments High Voltage Evaluation (TI_HV_EVM)

Gallium nitride (GaN) power stages
LMG2640 650V 105mΩ GaN half-bridge with integrated driver, protection and current sense
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Daughter card

LMG2640EVM-090 — LMG2640 daughter card

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Evaluation board

LMG342X-BB-EVM — LMG342x evaluation motherboard

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TI's Standard Terms and Conditions for Evaluation Items apply.

Technical documentation

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Type Title Date
EVM User's guide LMG2640 Half-Bridge Daughter Card Evaluation Module User's Guide PDF | HTML 07 Oct 2024
Certificate LMG2640EVM-090 EU Declaration of Conformity (DoC) 02 Oct 2024

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