The LMG2640 daughter card evaluation module (EVM) is designed to provide a quick and easy platform to evaluate TI's integrated GaN devices in any half-bridge topology. The board is designed to be interfaced with a larger system using the six power pins and 10 digital pins on the bottom edge of the board. Power pins form the main switching loop consisting of a high voltage DC bus, switch node and power ground. The digital pins control the LMG2640 device with PWM gate inputs, provide auxiliary power with low voltage supplies and report faults as a digital output. Evaluating the LMG2640EVM's performance is most easily demonstrated using a synchronous buck/boost motherboard from TI (LMG342X-BB-EVM). The daughtercard easily plugs into the motherboard and interfaces all power and digital control in an open-loop configuration for full system control. Additionally, a recommended footprint is provided to interface the daughtercard with a custom system for further testing.
Features
- Input voltage operation up to 650V
- Simple open loop design to evaluate performance of LMG2640
- Single/Dual PWM input on board for PWM signal with variable dead time
- Highly-integrated GaN power-FET half bridge with low-side current sense emulation output
- Convenient probe points for logic and power stage measurements with oscilloscope probes having short ground spring probes