This reference design is built keeping an electronic imaging system in mind. Image sensors today force heavy demands on ADCs in terms of: excellent linearity (DNL < 0.5 LSB and INL < 4 LSB), high resolution (12- to 18-bit), high speed (up to 20 MSPS), and high SNR (> 74-dB SNR) to assure superior image quality and freedom from distortion over time. Enabled by the low-noise, high-speed amplifier, fully differential amplifier (FDA), high-speed ADC, and low-noise LDO from TI, this reference design demonstrates how to design a high-performance analog signal chain for digitizing the pixel-output signal in thermal imaging cameras.
Features
- SNR, ENOB and THD: > 74 dB, 12-bit and < -84 dB
- Sampling speed: front-end circuit optimized for 10MSPS or lesser
- Analog input type: single-ended unipolar signal
- Integral Non-Linearity (INL) < 1 LSB (typical) and Differential Non-Linearity (DNL) < 0.5 LSB (typical)
- Output data interface: 1.8V parallel CMOS or DDR LVDS
- Overall power consumption: < 80 mW