SLVSE39B November 2017 – July 2018 DRV8304
UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA.
Refer to the PDF data sheet for device specific package drawings
The gate drivers implement adjustable VDS voltage monitors to detect overcurrent or short-circuit conditions on the external power MOSFETs. When the monitored voltage is greater than the VDS trip point (VVDS_OCP) for longer than the deglitch time (tOCP), an overcurrent condition is detected and action is taken according to the device VDS fault mode.
The high-side VDS monitors measure the voltage between the VDRAIN and SHx pins and the low-side VDS monitors measure the voltage between the SHx and SPx pins. If the current shunt amplifier is unused, tie the SP pins to the common ground point of the external half-bridges.
For the SPI device, the reference point of the low-side VDS monitor can be changed between the SPx and SNx pins if desired with the LS_REF register setting.
The VVDS_OCP threshold is programmable from 0.15 V to 1.8 V. Additional information on the VDS monitor levels are described in the Register Maps section for the SPI device and in the Pin Diagrams section hardware interface device.