SLLS822C July   2007  – December 2024 TRSF3221E

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  ESD Ratings, IEC Specifications
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Thermal Resistance Characteristics
    6. 5.6  Electrical Characteristics
    7. 5.7  Electrical Characteristics, Driver
    8. 5.8  Switching Characteristics, Driver
    9. 5.9  Electrical Characteristics, Receiver
    10. 5.10 Switching Characteristics, Receiver
    11. 5.11 Electrical Characteristics, Auto-Powerdown
    12. 5.12 Switching Characteristics, Auto-Powerdown
    13. 5.13 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
    4. 7.4 Device Functional Modes
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Typical Application
        1. 8.1.1.1 Design Requirements
        2. 8.1.1.2 Detailed Design Procedure
      2. 8.1.2 Application Performance Plot
    2. 8.2 Power Supply Recommendations
    3. 8.3 Layout
      1. 8.3.1 Layout Guidelines
      2. 8.3.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Switching Characteristics, Receiver

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 8-1)
PARAMETER TEST CONDITIONS(1) TYP(2) UNIT
tPLH Propagation delay time, low- to high-level output CL = 150 pF, See Figure 6-3

RGT package

100 ns

DB or PW package

150

tPHL Propagation delay time, high- to low-level output CL = 150 pF, See Figure 6-3

RGT package

125 ns

DB or PW package

150

ten Output enable time CL = 150 pF, RL = 3 kΩ, See Figure 6-4 200 ns
tdis Output disable time CL = 150 pF, RL = 3 kΩ, See Figure 6-4 200 ns
tsk(p) Pulse skew(3) See Figure 6-3

RGT package

25 ns

DB or PW package

50

Test conditions are C1–C4 = 0.1 μF at VCC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at VCC = 5 V ± 0.5 V.
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25°C.
Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.