JAJSM24A December   2023  – May 2024 ADC3910D025 , ADC3910D065 , ADC3910D125 , ADC3910S025 , ADC3910S065 , ADC3910S125

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics - Power Consumption
    6. 5.6  Electrical Characteristics - DC Specifications
    7. 5.7  Electrical Characteristics - AC Specifications (25 MSPS)
    8. 5.8  Electrical Characteristics - AC Specifications (65 MSPS)
    9. 5.9  Electrical Characteristics - AC Specifications (125 MSPS)
    10. 5.10 Timing Requirements
    11. 5.11 Output Interface Timing Diagram
    12. 5.12 Typical Characteristics - 25MSPS
    13. 5.13 Typical Characteristics - 65MSPS
    14. 5.14 Typical Characteristics - 125MSPS
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 ADC Features
        1. 6.3.1.1 Low Latency Mode
        2. 6.3.1.2 Full Digital Feature Mode
        3. 6.3.1.3 Interleaving Mode
      2. 6.3.2 Analog Input
        1. 6.3.2.1 Single Ended Input
        2. 6.3.2.2 Differential Input
        3. 6.3.2.3 Analog Input Bandwidth
      3. 6.3.3 Sampling Clock Input
      4. 6.3.4 Voltage Reference
      5. 6.3.5 Over-range (OVR)
      6. 6.3.6 Digital Features
        1. 6.3.6.1 Digital Down Converter
          1. 6.3.6.1.1 Digital Down Converter Data Select
          2. 6.3.6.1.2 Decimation Filter
          3. 6.3.6.1.3 DDC Over-range
          4. 6.3.6.1.4 Output Formatting with Decimation
        2. 6.3.6.2 Digital Comparator
          1. 6.3.6.2.1 Comparator Data Select
          2. 6.3.6.2.2 Comparator High and Low Threshold
          3. 6.3.6.2.3 Comparator Configuration Compare Mode
          4. 6.3.6.2.4 Comparator Event Configuration
        3. 6.3.6.3 Statistics Engine
          1. 6.3.6.3.1 Statistics Engine Data Select
          2. 6.3.6.3.2 Window Configuration
        4. 6.3.6.4 Digital Alerts
      7. 6.3.7 Digital Interface
        1. 6.3.7.1 Parallel CMOS Output
        2. 6.3.7.2 Serialized CMOS Output
      8. 6.3.8 Test Patterns
        1. 6.3.8.1 Bypass Test Pattern
        2. 6.3.8.2 Digital Test Pattern
    4. 6.4 Device Functional Modes
      1. 6.4.1 Normal Operation
      2. 6.4.2 Power Down Options
    5. 6.5 Programming
      1. 6.5.1 Configuration using the SPI interface
        1. 6.5.1.1 Register Write
        2. 6.5.1.2 Register Read
    6. 6.6 Register Maps
      1. 6.6.1 Register Descriptions
      2. 6.6.2 Statistics Engine Register Map
      3. 6.6.3 Alerts Register Map
  8. 7 Application Information Disclaimer
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
        1. 7.2.2.1 Input Signal Path
        2. 7.2.2.2 Sampling Clock
        3. 7.2.2.3 Voltage Reference
      3. 7.2.3 Application Curves
    3. 7.3 Initialization Set Up
      1. 7.3.1 Register Initialization During Operation
    4. 7.4 Power Supply Recommendations
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 ドキュメントの更新通知を受け取る方法
    2. 8.2 サポート・リソース
    3. 8.3 Trademarks
    4. 8.4 静電気放電に関する注意事項
    5. 8.5 用語集
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
PARAMETER TEST CONDITIONS MIN MAX UNIT
Supply voltage range 1.8 V, AVDD –0.3 2.1 V
Supply voltage range 1.8 V to 3.3 V, IOVDD –0.3 3.6
Supply voltage range, GND, DGND –0.3 0.3
Voltage applied to input pins INAP/M, INBP/M, CLK, DCLKIN –0.3 2.1
VREF –0.3 2.1
RESET, SCLK, SEN, SDIO, OEN –0.3 2.1
Junction temperature, TJ 110 °C
Storage temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.