4 改訂履歴
Changes from B Revision (June 2018) to C Revision
- Changed 「特長」セクションの安全関連の認定項目:VDE 認定のリビジョンを DIN V VDE V 0884-10 (VDE V 0884-11) から DIN VDE V 0884-11 に変更、IEC 60950-1、および IEC 60065 を IEC 62368-1 にGo
- Changed 「概要」セクションの DIN V VDE V を DIN VDE V にGo
- Changed CLR and CPG values from ≥ 9 mm to ≥ 8.5 mm in Insulation Specifications tableGo
- Changed Insulation Specifications table header row from DIN V VDE V 0884-11 (VDE V 0884-11): 2017-01 to DIN VDE V 0884-11: 2017-01Go
- Changed VDE certification details in Safety-Related Certifications tableGo
- Changed Safety Limiting Values table format as per current standardGo
- Changed free air to ambient in condition statement of Switching Characteristics tableGo
- Changed 6.05 dB to 6.02 dB in Equation 3Go
- Changed input common-mode voltage from 2 V to 1.9 V for consistency with Input Bias Current vs Common-Mode Input Voltage figure in What To Do and What Not To Do sectionGo
- Changed VINx to AINx in Layout Guidelines sectionGo
- Changed Recommended Layout of the AMC1306x figure to include connection to the shunt resistor and input filter componentsGo
Changes from A Revision (July 2017) to B Revision
- Changed Reinforced Isolation Capacitor Lifetime Projection figure Go
Changes from * Revision (March 2017) to A Revision
- AMC1306E05 および AMC1306M05 を量産にリリースGo
- Added AMC1306x05 を反映するため、最初のDC 性能項目に ±50µV をGo
- Changed 最初の安全関連の認定項目で規格のリビジョンを 0884-10 から 0884-11 にGo
- Changed 「概要」セクションの第 1 段落で VPEAK を 8000 から 7000 に、規格のリビジョンを 0884-10 から 0884-11 にGo
- Deleted Status column from Device Comparison TableGo
- Changed standard deviation from 0884-10 to 0884-11 in DIN V VDE V 0884-11 section of Insulation Specifications tableGo
- Changed standard deviation from 0884-10 to 0884-11 in Safety-Related Certifications tableGo
- Changed prevent to minimize in condition statement of Safety Limiting Values tableGo
- Added Electrical Characteristics: AMC1306x05 table Go
- Changed test conditions of Analog Inputs test conditions from (AINP – AINN) / 2 to AGND to (AINP + AINN) / 2 to AGND to include all possible conditionsGo
- Changed IIB test condition from Inputs shorted to AGND to AINP = AINN = AGND, IIB = IIBP + IIBNGo
- Added AINP = AINN = AGND to EO parameter test conditions Go
- Changed minus sign to plus or minus sign in typical specification of EG parameter Go
- Changed 10% to 90% to 90% to 10% in test conditions of tf parameter Go
- Added AMC1306x05 devices to Typical Characteristics section Go