4 Revision History
Changes from Revision D (February 2020) to Revision E (August 2023)
- ドキュメント全体にわたって表、図、相互参照の採番方法を更新Go
- Added two rows for input current in Absolute Maximum
Ratings
Go
- Changed output voltage drift vs time test conditions under
Voltage Reference Output from TA = 35ºC, 1900 hr to
TA = 25ºC, 1600 hr in the Electrical
Characteristics
Go
- Changed output voltage drift vs time value under Voltage
Reference Output from 20 µV to 50 ppm in the Electrical
Characteristics
Go
- Changed Figure 7-48, Internal Reference Voltage vs
Temperature
Go
- Changed Figure 7-49, Internal Reference Voltage vs Supply
Voltage
Go
- Added text to end of paragraph to clarify phase margin in Output
Amplifier sectionGo
- Changed text in Internal Reference section for
clarityGo
- Changed all instances of legacy terminology to controller and target
where I2C is mentionedGo
- Changed section 8.6.2, DEVID Register, to clarify and correct
reset valuesGo
Changes from Revision C (November 2019) to Revision D (February 2020)
- Changed Figure 29 to remove broken text from x axis (typo)Go
- Changed Figures 33, 34 and 35; updated for clarityGo
Changes from Revision B (August 2019) to Revision C (November 2019)
- DGS (VSSOP) パッケージをプレビューから量産データ (アクティブ) に変更Go
- Added TUE parameter for DGS package to electrical characteristics tableGo
- Added gain error parameter for DGS package to electrical characteristics tableGo
- Added full-scale error parameter for DGS package to electrical characteristics tableGo
Changes from Revision A (August 2019) to Revision B (August 2019)
- DAC70501 および DAC60501 デバイスをプレビューから量産データ (アクティブ) に変更Go