4 改訂履歴
Changes from B Revision (April 2013) to C Revision
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Added 「ESD定格」の表、「機能説明」セクション、「デバイスの機能モード」セクション、「アプリケーションと実装」セクション、「電源に関する推奨事項」セクション、「レイアウト」セクション、「デバイスおよびドキュメントのサポート」セクション、「メカニカル、パッケージ、および注文情報」セクションGo
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Updated thermal characteristic values based on latest simulation data Go
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Changed deserializer LVCMOS DC and supply current specification test conditions based on latest production tests Go
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Changed IOL test condition for VOL at VDDIO = 3.3 V to 3 mA Go
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Changed max value of Deserializer VOL to 0.45 V Go
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Changed test condition parameter for VOL Serial Control Characteristic Go
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Changed RPU = 10 kΩ condition for the Serial Control Bus Characteristics of tR and tF Go
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Added notes for serializer and deserializer switching characteristics verified by characterizationGo
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Added corresponding pins for deserializer tCLH and tCHL parameterGo
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Added test condition to tDD deserializer parameter Go
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Changed corrected units for deserializer lock time and delay parameter Go
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Added serial stream and video control signal filter waveform to Feature Description Go
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Changed "NA" and "Disable" term in Table 5 and Table 6 to "Off" Go
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Changed output states to correct values based on OSS_SEL and PDB configuration in Table 7 Go
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Added details for Deserializer Map Select strap pin configuration Go
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Added clarification on the state of deserializer outputs during BIST mode operationGo
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Added statement to set input to low when entering BIST mode with DS90C241 or DS90UR241 Go
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Added note that ID[X] cannot be tied to VSS, as only four device addresses are supported Go
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Added RID tolerance and tablenote that RID ≠ 0 Ω to set ID[X] Go
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Changed statement that CONFIG settings can also by programmed via register Go
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Changed bit description to swap definition for Serializer RFB and VODGo
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Changed bit definition for Deserializer OSS_SEL Go
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Changed definition from Reserved to MAP_SEL for Deserializer Reg 0x02[5:4] Go
Changes from A Revision (April 2013) to B Revision
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Changed layout of National Semiconductor Data Sheet to TI formatGo