SLVS047L November   1981  – January 2015 LM237 , LM337

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Simplified Schematic
  5. 5 Revision History
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Electrical Characteristics
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Design Schematic
    4. 8.4 Feature Description
      1. 8.4.1 Output Voltage Adjustment
    5. 8.5 Device Functional Modes
      1. 8.5.1 Adjustable Output Mode
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 General Configurations
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Related Links
    2. 12.2 Trademarks
    3. 12.3 Electrostatic Discharge Caution
    4. 12.4 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7 Specifications

7.1 Absolute Maximum Ratings

over operating temperature ranges (unless otherwise noted)(1)
MIN MAX UNIT
VI – VO Input-to-output differential voltage –40 V
TJ Operating virtual junction temperature 150 °C
Lead temperature 1.6 mm (1/16 in) from case for 10 s 260 °C
Tstg Storage temperature range –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

7.2 ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) 1500 V
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) 1500
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.3 Recommended Operating Conditions

MIN MAX UNIT
VI-VO Input-to-output differential voltage -2.5 -37
IO Output current |VI – VO| ≤ 40 V, P ≤ 15 W 10 1500 mA
|VI – VO| ≤ 10 V, P ≤ 15 W 6 1500
TJ Operating virtual junction temperature LM237 –25 150 °C
LM337 0 125

7.4 Thermal Information

THERMAL METRIC(1) LM237 LMx37 LM337 UNIT
KC KCS KTE KTP KTT KVU
4 PINS 4 PINS 4 PINS 4 PINS 4 PINS 4 PINS
RθJA Junction-to-ambient thermal resistance 24.8 24.8 23 28 25.3 30.3 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 3 3 3 19 30.3 N/A
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report (SPRA953).

7.5 Electrical Characteristics

over recommended ranges of operating virtual junction temperature (unless otherwise noted)
PARAMETER TEST CONDITIONS(1) LM237 LM337 UNIT
MIN TYP MAX MIN TYP MAX
Input regulation(2) VI – VO = –3 V to –40 V TJ = 25°C 0.01 0.02 0.01 0.04 %/V
TJ = MIN to MAX 0.02 0.05 0.02 0.07
Ripple rejection VO = –10 V, f = 120 Hz 60 60 dB
VO  = –10 V, f = 120 Hz, CADJ = 10 μF 66 77 66 77
Output regulation IO = 10 mA to 1.5 A,
TJ = 25°C		 |VO| ≤ 5 V 25 50 mV
|VO| ≥ 5 V 0.3% 0.5% 0.3% 1% —
IO = 10 mA to 1.5 A |VO| ≤ 5 V 50 70 mV
|VO| ≥ 5 V 1% 1.5% —
Output-voltage change with temperature TJ = MIN to MAX 0.6% 0.6% —
Output-voltage long-term drift After 1000 h at TJ = MAX and VI – VO = –40 V 0.3% 1% 0.3% 1% —
Output noise voltage f = 10 Hz to 10 kHz, TJ = 25°C 0.003% 0.003% —
Minimum output current to maintain regulation |VI – VO| ≤ 40 V 2.5 5 2.5 10 mA
|VI – VO| ≤ 10 V 1.2 3 1.5 6
Peak output current |VI – VO| ≤ 15 V 1.5 2.2 1.5 2.2 A
|VI – VO| ≤ 40 V, TJ = 25°C 0.24 0.4 0.15 0.4
ADJUSTMENT current 65 100 65 100 μA
Change in ADJUSTMENT current VI – VO = –2.5 V to –40 V, IO = 10 mA to MAX, TJ = 25°C 2 5 2 5 μA
Reference voltage (OUTPUT to ADJUSTMENT) VI – VO = –3 V to –40 V,
IO = 10 mA to 1.5 A,
P ≤ rated dissipation		 TJ = 25°C –1.225 –1.25 –1.275 –1.213 –1.25 –1.287 V
TJ = MIN to MAX –1.2 –1.25 –1.3 –1.2 –1.25 –1.3
Thermal regulation Initial TJ = 25°C, 10-ms pulse 0.002 0.02 0.003 0.04 %/W
(1) Unless otherwise noted, the following test conditions apply: |VI  – VO| = 5 V and IO = 0.5 A. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions. All characteristics are measured with a 0.1-μF capacitor across the input and a 1-μF capacitor across the output. Pulse-testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be taken into account separately.
(2) Input regulation is expressed here as the percentage change in output voltage per 1-V change at the input.

7.6 Electrical Characteristics

TJ = 25°C
PARAMETER TEST CONDITIONS(1) LM237, LM337 UNIT
MIN TYP MAX
Input regulation(2) VI  – VO = –3 V to –40 V 0.01 0.04 %/V
Ripple rejection VO = –10 V, f = 120 Hz 60 dB
VO  = –10 V, f = 120 Hz, CADJ = 10 μF 66 77
Output regulation IO = 10 mA to 1.5 A |VO| ≤ 5 V 50 mV
|VO| ≥ 5 V 0.3% 1% —
Output noise voltage f = 10 Hz to 10 kHz 0.003% —
Minimum output current to maintain regulation |VI – VO| ≤ 40 V 2.5 10 mA
|VI – VO| ≤ 10 V 1.5 6
Peak output current |VI – VO| ≤ 15 V 1.5 2.2 A
|VI – VO| ≤ 40 V 0.15 0.4
ADJUSTMENT current 65 100 μA
Change in ADJUSTMENT current VI – VO = –2.5 V to –40 V, IO = 10 mA to MAX 2 5 μA
Reference voltage
(OUTPUT to ADJUSTMENT)		 VI – VO = –3 V to –40 V, IO = 10 mA to 1.5 A, P ≤ rated dissipation –1.213 –1.25 –1.287 V
(1) Unless otherwise noted, the following test conditions apply: |VI – VO| = 5 V and IO = 0.5 A. All characteristics are measured with a 0.1-μF capacitor across the input and a 1-μF capacitor across the output. Pulse-testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must be taken into account separately.
(2) Input regulation is expressed here as the percentage change in output voltage per 1-V change at the input.

7.7 Typical Characteristics

adjvoltage_lm237.gifFigure 1. Adjustment Voltage vs Load current (VIN = -4.3 V)