2 改訂履歴
Changes from November 23, 2013 to September 25, 2018
- ドキュメント全体を通してフォーマットを変更、編成の変更とセクションの番号付け追加も含むGo
- 「製品情報」表を追加Go
- Section 1.4を追加し、すべての機能ブロック図をこのセクションに移動Go
- Figure 1-2でUSCIモジュールの数を変更し、注を追加Go
- Figure 1-3で、USCI0をUSCI1に変更Go
- Added Section 3, Device Comparison, and moved Table 3-1, Family Members, to itGo
- In Table 3-1, changed the number of USCI modules in the 48-pin packages from 1 to 2 and added note about limitations on simultaneous useGo
- Added Section 3.1, Related ProductsGo
- Changed the title of Table 4-1 from Terminal Functions to Signal DescriptionsGo
- Added "with port interrupt" to P2.7 description in Table 4-1, Signal DescriptionsGo
- Added "Port U is supplied by the LDOO rail" to the PU.0 and PU.1 descriptions in Table 4-1, Signal DescriptionsGo
- Added typical conditions statements at the beginning of Section 5, SpecificationsGo
- Added Section 5 and moved all electrical specifications to itGo
- Added Section 5.2, ESD RatingsGo
- Moved Section 5.6, Thermal Resistance CharacteristicsGo
- Changed the TYP value of the CL,eff parameter with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pF in Section 5.14, Crystal Oscillator, XT1, Low-Frequency ModeGo
- Changed the MIN value of the V(DVCC_BOR_hys) parameter from 60 mV to 50 mV in Section 5.19, PMM, Brownout Reset (BOR)Go
- Updated notes (1) and (2) and added note (3) in Section 5.25, Wake-up Times From Low-Power Modes and ResetGo
- Changed (corrected) the port pins muxed with ADC10 pins in V(Ax) Test Conditions in Section 5.34, 10-Bit ADC, Power Supply and Input Range ConditionsGo
- Removed ADC10DIV from the formula for the TYP value in the second row of the tCONVERT parameter in Section 5.35, 10-Bit ADC, Timing Parameters, because ADC10CLK is after divisionGo
- Updated Test Conditions for all parameters in Section 5.36, 10-Bit ADC, Linearity Parameters: changed from "CVREF+ = 20 pF" to "CVeREF+ = 20 pF"; changed from "(VeREF+ – VeREF–)min ≤ (VeREF+ – VeREF–)" to "1.4 V ≤ (VeREF+ – VeREF–)"Go
- Added "CVeREF+ = 20 pF" to EI Test Conditions in Section 5.36, 10-Bit ADC, Linearity ParametersGo
- Added "ADC10SREFx = 11b" to Test Conditions for EG and ET in Section 5.36, 10-Bit ADC, Linearity ParametersGo
- Changed the MIN value of AVCC(min) with Test Conditions of "REFVSEL = {0} for 1.5 V" from 2.2 V to 1.8 V in Section 5.38, REF, Built-In ReferenceGo
- Changed the value of CBREFACC in both Test Conditions for the IAVCC_REF parameter (changed first row from 0 to 1; changed second row from 1 to 0) in Section 5.39, Comparator_BGo
- Changed the MAX value of the tEN_CMP parameter with Test Conditions of "CBPWRMD = 10" from 1.5 µs to 100 µs in Section 5.39, Comparator_BGo
- Changed the note that starts "Tools that access the Spy-Bi-Wire and BSL interfaces..."Go
- Throughout document, changed all instances of "bootstrap loader" to "bootloader"Go
- Corrected spelling of NMIIFG in Table 6-8, System Module Interrupt Vector RegistersGo
- Changed Figure 6-8, Port P5 (P5.3) Diagram, (added P5SEL.2 and XT2BYPASS inputs with AND and OR gates)Go
- Changed P5SEL.3 column from X to 0 for "P5.3 (I/O)" rows in Table 6-48, Port P5 (P5.2 and P5.3) Pin FunctionsGo
- Changed Figure 6-10, Port P5 (P5.5) Diagram, (added P5SEL.5 input and OR gate)Go
- Changed P5SEL.5 column from X to 0 for "P5.5 (I/O)" rows in Table 6-49, Port P5 (P5.4 and P5.5) Pin FunctionsGo
- Changed Table 6-51, Port PU.0, PU.1 FunctionsGo
- Added ZQE and PT packages in heading row of Table 6-53, Device DescriptorsGo
- Section 7「デバイスおよびドキュメントのサポート」を追加Go
- Section 8「メカニカル、パッケージ、および注文情報」を追加Go