4 改訂履歴
Changes from B Revision (June 2014) to C Revision
- Deleted "C55" marking on pinout drawing in Pin Configuration and Functions section Go
- Added Pin Functions table to Pin Configuration and Functions section Go
- Deleted storage temperature range from ESD Ratings table and moved to Absolute Maximum Ratings table Go
- Changed title of Handling Ratings table to ESD Ratings table Go
- Added Recommended Operating Conditions table Go
- Added Functional Block Diagram Go
- Deleted "Independent enable pins are available for each channel, which provide maximum design flexibility" from Enable Function sectionGo
- Deleted Input and ESD Protection subsection in Feature Description sectionGo
- Added Device Functional Modes sectionGo
- Added Typical Applications section to Application and Implementation section Go
- Added Design Requirements subsection to Typical Applications section Go
- Added Detailed Design Procedure subsection to Typical Application section Go
- Added application curves to the Typical Application section Go
- Added High-Impedance Sensor Interface, Driving ADCs, and Active Filter subsections to Typical Application sectionGo
- Added Power Supply Recommendations section Go
- Added layout example image to Layout sectionGo
Changes from A Revision (December 2013) to B Revision
- Changed デバイスのステータスを「製品プレビュー」から「量産データ」にGo