JAJSJF1B March   2014  – September 2020 TPS2556-Q1 , TPS2557-Q1

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Terminal Configuration and Functions
    1.     Terminal Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 Handling Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Switching Characteristics
    7. 7.7 Typical Characteristics
      1.      16
  8. 8 Parameter Measurement Information
    1.     18
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Overcurrent Conditions
      2. 9.3.2 FAULT Response
      3. 9.3.3 Thermal Sense
    4. 9.4 Device Functional Modes
      1. 9.4.1 Undervoltage Lockout (UVLO)
      2. 9.4.2 Enable ( EN OR EN)
      3. 9.4.3 Auto-Retry Functionality
      4. 9.4.4 Two-Level Current-Limit Circuit
  10. 10Applications and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application, Design for Current Limit
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 Determine Design Parameters
        2. 10.2.2.2 Programming the Current-Limit Threshold
        3. 10.2.2.3 Selecting Current-Limit Resistor 1
        4. 10.2.2.4 Selecting Current-Limit Resistor 2
        5. 10.2.2.5 Accounting for Resistor Tolerance
        6. 10.2.2.6 Power Dissipation and Junction Temperature
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
    1.     44
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Related Links
    2. 13.2 Trademarks
    3. 13.3 Electrostatic Discharge Caution
    4. 13.4 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.2 Handling Ratings

PARAMETERMINMAXUNIT
TstgStorage temperature range–65150°C
V(ESD)(1)Human-body model (HBM) ESD stress voltage(2)–22kV
Charged-device model (CDM) ESD stress voltage(3)–750750V
System level(4)Contact discharge–88kV
Air discharge–1515
(1) Electrostatic discharge (ESD) to measure device sensitivity or immunity to damage caused by assembly-line electrostatic discharges into the device.
(2) The passing level per AEC-Q100 Classification H2.
(3) The passing level per AEC-Q100 Classification C5.
(4) Surges per EN61000-4-2, 1999 applied between USB connection for V(BUS) and ground of the TPS2556EVM (HPA423, replacing TPS2556 with TPS2556-Q1) evaluation module (SLUU393). These were the test levels, not the failure threshold.