JAJSP69 November 2023 TPSM828510 , TPSM828511 , TPSM828512
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SUPPLY | ||||||
IQ | Quiescent current | EN = VIN, no load, device not switching, MODE = GND, VOUT = 0.6 V | 20 | 32 | μA | |
ISD | Shutdown current | EN = GND, typical value at TJ = 25°C, maximum value at TJ = 125°C | 1.5 | 18 | μA | |
VUVLO | Undervoltage lock out threshold | VIN rising | 2.45 | 2.6 | 2.7 | V |
VIN falling | 2.1 | 2.5 | 2.6 | V | ||
TJSD | Thermal shutdown threshold | TJ rising | 170 | °C | ||
Thermal shutdown hysteresis | TJ falling | 15 | °C | |||
CONTROL and INTERFACE | ||||||
VEN,IH | Input threshold voltage at EN, rising edge | 1.05 | 1.1 | 1.15 | V | |
VEN,IL | Input threshold voltage at EN, falling edge | 0.96 | 1.0 | 1.05 | V | |
VIH | High-level input-threshold voltage at MODE/SYNC | 1.1 | V | |||
IEN,LKG | Input leakage current into EN | VIH = VIN or VIL = GND | 125 | nA | ||
VIL | Low-level input-threshold voltage at MODE/SYNC | 0.3 | V | |||
ILKG | Input leakage current into MODE/SYNC | 100 | nA | |||
tDelay | Enable delay time | Time from EN high to device starts switching; VIN applied already | 85 | 150 | 470 | µs |
tRamp | Output voltage ramp time, CSS = 4.7 nF | Time from device starts switching to power good; device not in current limit | 0.8 | 1.3 | 1.8 | ms |
tRamp | Output voltage ramp time, SS/TR pin open | Time from device starts switching to power good; device not in current limit | 90 | 150 | 210 | µs |
ISS/TR | SS/TR source current | 2 | 2.5 | 2.8 | uA | |
Tracking gain | VFB / VSS/TR | 1 | ||||
Tracking offset | VFB when VSS/TR = 0 V | ±1 | mV | |||
fSYNC | Frequency range on MODE/SYNC pin for synchronization | 1.8 | 4 | MHz | ||
Duty cycle of synchronization signal at MODE/SYNC | 20 | 80 | % | |||
Time to lock to external frequency | 50 | µs | ||||
VTH_PG | UVP power good threshold voltage; DC level |
rising (%VFB) | 92 | 95 | 98 | % |
VTH_PG | UVP power good threshold voltage; DC level |
falling (%VFB) | 87 | 90 | 93 | % |
VTH_PG | OVP power good threshold voltage; DC level |
rising (%VFB) | 107 | 110 | 113 | % |
OVP power good threshold voltage; DC level |
falling (%VFB) | 104 | 107 | 111 | % | |
VPG,OL | Low-level output voltage at PG | ISINK_PG = 2 mA | 0.07 | 0.3 | V | |
IPG,LKG | Input leakage current into PG | VPG = 5 V | 100 | nA | ||
tPG | PG deglitch time | for a high level to low level transition on the power good output | 40 | µs | ||
OUTPUT | ||||||
VFB | Feedback voltage, adjustable version | 0.6 | V | |||
IFB,LKG | Input leakage current into FB, adjustable version | VFB = 0.6 V | 1 | 70 | nA | |
VFB | Feedback voltage accuracy | PWM, VIN ≥ VOUT + 1 V | –1 | 1 | % | |
VFB | Feedback voltage accuracy | PFM, VIN ≥ VOUT + 1 V, VOUT ≥ 1.0 V, Co,eff ≥ 10 µF | –1 | 2 | % | |
VFB | Feedback voltage accuracy | PFM, VIN ≥ VOUT + 1 V, VOUT < 1.0 V, Co,eff ≥ 15 µF |
–1 | 3 | % | |
VFB | Feedback voltage accuracy with voltage tracking | VIN ≥ VOUT + 1 V, VSS/TR = 0.3 V | –4 | 4 | % | |
Load regulation | PWM | 0.05 | %/A | |||
Line regulation | PWM, IOUT = 1 A, VIN ≥ VOUT + 1 V | 0.02 | %/V | |||
RDIS | Output discharge resistance | 100 | Ω | |||
fSW | PWM Switching frequency | 2.025 | 2.25 | 2.475 | MHz | |
ton,min | Minimum on-time of high-side FET | VIN = 3.3 V, TJ = -40°C to 125°C | 35 | 52 | ns | |
ton,min | Minimum on-time of low-side FET | 10 | ns | |||
RDP | Dropout resistance | VIN ≥ 5 V |
85 | 120 | mΩ | |
ILIMH | High-side FET switch current limit | DC value, for TPSM828512; VIN = 3 V to 6 V |
2.85 | 3.4 | 3.9 | A |
ILIMH | High-side FET switch current limit | DC value, for TPSM828511; VIN = 3 V to 6 V |
2.1 | 2.6 | 3.0 | A |
ILIMH | High-side FET switch current limit | DC value, for TPSM828510; VIN = 3 V to 6 V |
1.6 | 2.1 | 2.5 | A |
ILIMNEG | Low-side FET negative current limit | DC value | –1.8 | A |