For related documentation see the following:
- Texas
Instruments, TPS7H2211-SP
Total Ionizing Dose (TID) radiation
report
- Texas Instruments, TPS7H2211-SEP Total
Ionizing Dose (TID) Radiation
Report
- Texas
Instruments, TPS7H2211-SP Single-Event Effects (SEE)
radiation report
- Texas Instruments, Single-Event-Effects Test Report of the
TPS7H2211-SEP eFuse
- Texas
Instruments, TPS7H2211EVM-CVAL Evaluation Module user's
guide
- Texas Instruments, TPS7H2211EVM
Evaluation Module (EVM)
- Texas Instruments, Basics of Load Switches
application report
- Texas Instruments, Basics of eFuses
application report
- Standard
Microcircuit Drawing (SMD),
5962R18220
- Vendor Item Drawing
(VID), V6223609