SBOK083A August   2024  – October 2024 TMUX582F-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-Up (SEL) Results
    2. 5.2 Event Rate Calculations
    3. 5.3 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References
  11. 8Revision History

8 Revision History

Changes from Revision * (August 2024) to Revision A (October 2024)

  • Updated SEL section to reflect the current device specificationsGo
  • Added SET data taken from the TMUX582F-SEP deviceGo