SFFS046 January 2021 TPS1HB35-Q1
The failure mode distribution estimation for TPS1HB35-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT open (HiZ) | 20% |
| VOUT stuck on (VBB) | 10% |
| VOUT functional, not in specification voltage or timing | 45% |
| Diagnostics not in specification | 10% |
| Protect functions fails to trip | 10% |
| Pin to Pin short any two pins | 5% |