SLLA525A October 2020 – April 2021 TCAN1043-Q1 , TCAN1043G-Q1 , TCAN1043H-Q1 , TCAN1043HG-Q1
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This document contains information for TCAN1043-Q1 (as well as the TCAN1043G-Q1, TCAN1043H-Q1, and TCAN1043HG-Q1), a controller area network (CAN) transceiver, to aid in a functional safety system design. The TCAN1043-Q1 comes in the SOIC (D) and VSON (DMT) packages. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
This section provides Functional Safety Failure In Time (FIT) rates for TCAN1043-Q1 (as well as TCAN1043G-Q1, TCAN1043H-Q1, and TCAN1043HG-Q1) based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 14-pin SOIC (D) | FIT (Failures Per 109 Hours) 14-pin VSON (DMT) |
---|---|---|
Total Component FIT Rate | 21 | 9 |
Die FIT Rate | 3 | 3 |
Package FIT Rate | 18 | 6 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog / mixed | 20 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for TCAN1043-Q1 (as well as TCAN1043G-Q1, TCAN1043H-Q1, and TCAN1043HG-Q1) in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Receiver fail | 35% |
Transmitter fail | 35% |
System stuck in sleep mode | 15% |
CANL or CANH driver biased dominant indefinitely | 5% |
Short-circuit of any two pins | 5% |
Reports erroneous fault condition | 5% |
This section provides a Failure Mode Analysis (FMA) for the pins of the TCAN1043-Q1 (as well as the TCAN1043G-Q1, TCAN1043H-Q1, and TCAN1043HG-Q1). The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-7 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TCAN1043-Q1 SOIC pin diagram. Figure 4-2 shows the TCAN1043-Q1 VSON pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TCAN1043-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | TXD will be biased dominant indefinitely and device will enter dominant time out mode. Unable to transmit data. | B |
GND | 2 | None | D |
VCC | 3 | Device will be in protected mode, high current draw from external regulator supplying VCC. | B |
RXD | 4 | Receiver output biased recessive indefinitely. Host unable to receive data from bus. | B |
VIO | 5 | Device will be in protected mode. Transceiver passive on bus, and high current draw from external regulator supplying VIO. | B |
EN | 6 | EN pin biased low, device will not be able to enter normal mode. Unable to communicate. | B |
INH | 7 | High ISUP current, INH pin may be damaged and indication from sleep mode transition not available. | A |
nFAULT | 8 | nFAULT pin biased low indefinitely which indicates a fault indefinitely. | B |
WAKE | 9 | WAKE pin biased low indefinitely, will not be able to utilize local wake-up function. | B |
VSUP | 10 | Device unpowered, high ISUP current. | B |
NC | 11 | None | D |
CANL | 12 | VO(REC) spec violated. Degraded EMC performance. | C |
CANH | 13 | Device cannot drive dominant to the bus, no communication possible. | B |
nSTB | 14 | nSTB biased low indefinitely, transceiver unable to enter normal mode. Unable to communicate. | B |
Thermal Pad | - | None | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | TXD pin defaults to a recessive bias, device is always recessive and unable to transmit data. | B |
GND | 2 | Device unpowered. | B |
VCC | 3 | Device in protected mode. | B |
RXD | 4 | No RXD output, unable to receive data. | B |
VIO | 5 | Device in protected mode. | B |
EN | 6 | EN pin defaults to a logic-low bias, device will not be able to enter normal mode. Unable to communicate. | B |
INH | 7 | None | D |
nFAULT | 8 | No effect on performance, unable to monitor system faults. | B |
WAKE | 9 | No effect on device performance, will not be able to utilize local wake-up function. | B |
VSUP | 10 | Device unpowered. | B |
NC | 11 | None | D |
CANL | 12 | Device cannot drive dominant on bus, unable to communicate. | B |
CANH | 13 | Device cannot drive dominant on bus, unable to communicate. | B |
nSTB | 14 | nSTB defaults to a logic-low bias, device will not be able to enter normal mode. Unable to communicate. | B |
Thermal Pad | - | None | D |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
TXD | 1 | GND | TXD will be biased dominant indefinitely and device will enter dominant time out mode. Unable to transmit data. | B |
GND | 2 | VCC | Device will be in protected mode, high ICC current. | B |
VCC | 3 | RXD | RXD output biased recessive indefinitely, controller unable to receive data from CAN bus. | B |
RXD | 4 | VIO | RXD output biased recessive indefinitely, controller unable to receive data from CAN bus. | B |
VIO | 5 | EN | EN pin biased high indefinitely, device will be unable to enter standby and silent mode. | B |
EN | 6 | INH | Absolute maximum violation on EN pin except in sleep mode. Transceiver may be damaged. | A |
nFAULT | 8 | WAKE | Potential absolute maximum violation on nFAULT pin if WAKE is biased high. Transceiver may be damaged. | A |
WAKE | 9 | VSUP | WAKE biased high indefinitely, unable to utilize local wake-up function. | B |
VSUP | 10 | NC | None | D |
NC | 11 | CANL | None | D |
CANL | 12 | CANH | Bus biased recessive, no communication possible. IOS current may be reached on CANH/CANL. | B |
CANH | 13 | nSTB | Driver and receiver turn off when the CAN bus is recessive. May not enter normal mode. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | Absolute maximum violation, transceiver may be damaged. | A |
GND | 2 | Device unpowered, high ISUP current. | B |
VCC | 3 | Absolute maximum violation, transceiver may be damaged. | A |
RXD | 4 | Absolute maximum violation, transceiver may be damaged. | A |
VIO | 5 | Absolute maximum violation, transceiver may be damaged. | A |
EN | 6 | Absolute maximum violation, transceiver may be damaged. | A |
INH | 7 | Minimal current driven into the INH pin. | D |
nFAULT | 8 | Absolute maximum violation, transceiver may be damaged. | A |
WAKE | 9 | WAKE biased high, unable to utilize local wake-up function. | B |
VSUP | 10 | None | D |
NC | 11 | None | D |
CANL | 12 | IOS current may be reached. RXD always recessive. | B |
CANH | 13 | VO(REC) spec violated, degraded EMC performance and communcation errors may result as well. | C |
nSTB | 14 | Absolute maximum violation, transceiver may be damaged. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | TXD biased recessive indefinitely, unable to transmit data. | B |
GND | 2 | Device unpowered, high current draw from external regulator supplying VCC. | B |
VCC | 3 | None | D |
RXD | 4 | Receiver output biased recessive indefinitely. Host unable to receive data from bus. | B |
VIO | 5 | IO pins will operate as 5V input/outputs. Microcontroller may be damaged if VCC > VIO. | C |
EN | 6 | EN biased high indefinitely, device will be unable to enter standby and silent mode. | B |
INH | 7 | Absolute maximum violation on VCC pin, INH will be biased at VCC voltage, system may not wake up. | B |
nFAULT | 8 | nFAULT biased high indefinitely, transceiver unable to report faults. | B |
WAKE | 9 | None | D |
VSUP | 10 | Absolute maximum violation on VCC. | B |
NC | 11 | None | D |
CANL | 12 | IOS current may be reached, RXD always recessive. | B |
CANH | 13 | VO(REC) spec violated, degraded EMC performance. | C |
nSTB | 14 | nSTB biased high indefinitely, transceiver unable to enter standby and sleep mode. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | TXD biased recessive indefinitely, unable to transmit data. | B |
GND | 2 | Device unpowered, high current draw from external regulator supplying VIO. | B |
VCC | 3 | IO pins will operate as 5V input/outputs. Microcontroller may be damaged if VCC > VIO. | C |
RXD | 4 | Receiver output biased recessive indefinitely. Host unable to receive data from bus. | B |
VIO | 5 | None | D |
EN | 6 | EN biased high indefinitelyf, device will be unable to enter standby and silent mode. | B |
INH | 7 | Absolute maximum violation on VIO pin, INH will be biased at VIO voltage, system may not wake up. | B |
nFAULT | 8 | nFAULT biased high indefinitely, transceiver unable to report faults. | B |
WAKE | 9 | None | D |
VSUP | 10 | Absolute maximum violation on VIO. | B |
NC | 11 | None | D |
CANL | 12 | IOS current may be reached, RXD always recessive. | B |
CANH | 13 | VO(REC) spec violated, degraded EMC performance. | C |
nSTB | 14 | nSTB biased high indefinitely, transceiver unable to enter standby and sleep mode. | B |