SWCU185G January 2018 – June 2024 CC1312PSIP , CC1312R , CC1352P , CC1352R , CC2642R , CC2642R-Q1 , CC2652P , CC2652PSIP , CC2652R , CC2652RB , CC2652RSIP , CC2662R-Q1
In the CC13x2 and CC26x2 device platform, the debug subsystem implements two IEEE standards for debug and test purposes:
The debug subsystem also implements a firewall for unauthorized access to debug/test ports. Figure 7-1 shows a block diagram of debug subsystem.
The IEEE 1149.1 TAP uses the following signals to support the operation:
There is no dedicated I/O pin for TRST. The debug subsystem is reset with system-wide resets and power-on reset.
The TAP controller, a state machine whose transitions are controlled by the TMS signal, controls the behavior of the JTAG system. Figure 7-2 shows the state-transition diagram for JTAG.
Every state has two exits, so all transitions can be controlled by the single TMS signal sampled on TCK. The two main paths allow for setting or retrieving information from either a data register (DR) or the instruction register (IR) of the device. The data register depends on the value loaded into the instruction register.