SLVA528D September   2012  – August 2021 TPS65381-Q1 , TPS65381A-Q1

 

  1.   Trademarks
  2. 1Introduction
  3. 2Product Overview
    1. 2.1 Safety Functions and Diagnostics Overview
    2. 2.2 Target Applications
    3. 2.3 Product Safety Constraints
  4. 3Development Process for Management of Systematic Faults
    1. 3.1 TI New-Product Development Process
  5. 4TPS65381x-Q1 Product Architecture for Management of Random Faults
    1. 4.1 Device Operating States
    2.     Device Operating States (continued)
    3. 4.2 NRES (MCU Reset) Driver and ENDRV (SAFING Path Enable) Driver
  6. 5TPS65381x-Q1 Architecture Safety Mechanisms and Assumptions of Use
    1. 5.1 Power Supply
    2. 5.2 Regulated Supplies
      1. 5.2.1 VDD6 Buck Switch-Mode Supply
      2. 5.2.2 VDD5 Linear Supply
      3. 5.2.3 VDD3/5 Linear Supply
      4. 5.2.4 VDD1 Linear Supply
      5. 5.2.5 VSOUT1 Linear Supply
      6. 5.2.6 Charge Pump
    3. 5.3 Diagnostic, Monitoring, and Protection Functions
      1. 5.3.1 External MCU Fault Detection and Management
        1. 5.3.1.1 External MCU Error Signal Monitor (MCU ESM)
        2. 5.3.1.2 Watchdog Timer
      2. 5.3.2 Voltage Monitor (VMON)
      3. 5.3.3 Loss-of-Clock Monitor (LCMON)
      4. 5.3.4 Junction Temperature Monitoring and Current Limiting
      5. 5.3.5 Analog and Digital MUX (AMUX and DMUX) and Diagnostic Output Pin (DIAG_OUT)
      6. 5.3.6 Analog Built-In Self-Test (ABIST)
      7. 5.3.7 Logic Built-In Self-Test (LBIST)
      8. 5.3.8 Device Configuration Register Protection
  7. 6Application Diagrams
    1. 6.1 TPS65381x-Q1 With TMS570
    2. 6.2 TPS65381x-Q1 With C2000
    3. 6.3 TPS65381x-Q1 With TMS470
  8. 7TPS65381x-Q1 as Safety Element out of Context (SEooC)
    1. 7.1 TPS65381x-Q1 Used in an EV/HEV Inverter System
    2. 7.2 SPI Note
  9. 8Revision History

8 Revision History

Changes from Revision C (January 2018) to Revision D (August 2021)

  • Updated the numbering format for tables, figures, and cross-references throughout the documentGo
  • Updated the Development Process for Management of Systematic Faults sectionGo
  • Updated the Figure TPS65381x-Q1 with C2000 to include updated C2000 MCU devicesGo
  • Updated footnote for Figure EV/HEV Inverter System with C2000 to include updated C2000 MCU devicesGo

Changes from Revision B (May 2017) to Revision C (January 2018)

  • Added clarification in the VDD1 Linear Supply section about the VDD1_G pin and VDD1_SENSE pin short circuit to pin considerations.Go
  • Added clarification in the Junction Temperature Monitoring and Current Limiting section about status bits and DMUX signal outputs. Go
  • Added clarification in the Junction Temperature Monitoring and Current Limiting section about indirect current limit from VDD6 for VDD1 linear regulator controller with external FET. Go

Changes from Revision A (October 2014) to Revision B (March 2017)

  • Added the TPS65381A-Q1 device to the documentGo
  • Changed all sections with the addition of TPS65381A-Q1 and updated product data sheets for both TPS65381-Q1 and TPS65381A-Q1Go