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TLC69650-Q1

ACTIVO

Controlador MOSFET de 8 barridos para aplicaciones de retroiluminación con atenuación local de matri

Detalles del producto

Rating Automotive Operating temperature range (°C) -40 to 125 Vin (min) (V) 3 Vin (max) (V) 5.5 Features Hybrid Dimming/Phase Shift, LED Open Detection, LED Short Detection, Local dimming, Serial interface
Rating Automotive Operating temperature range (°C) -40 to 125 Vin (min) (V) 3 Vin (max) (V) 5.5 Features Hybrid Dimming/Phase Shift, LED Open Detection, LED Short Detection, Local dimming, Serial interface
HTSSOP (PWP) 28 62.08 mm² 9.7 x 6.4 WQFN (RTW) 24 16 mm² 4 x 4
  • AEC-Q100 qualified for automotive applications:
    • Device temperature grade 1: –40°C to +125°C, TA
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B
  • Functional Safety-Capable:
    • Documentation available to aid functional safety system design
  • Full array local dimming topology:

    • Support up to 1024 devices cascaded

  • Operating voltage VCC range: 3V to 5.5V
  • Flexible P-MOSFET driving options:
    • Maximum channel current / voltage:
      • 30mA / 20V: TLC69600-Q1
      • 60mA / 20V: TLC69610-Q1
      • 30mA / 50V: TLC69650-Q1
      • 60mA / 50V: TLC69660-Q1
    • Global 8-bit Maximum Current (MC) setting
    • Individual 8-bit Channel Current (CC) setting
  • High speed daisy chain interface:
    • I/O voltage compatible with: 1.8V / 3.3V
    • Data transfer rate: up to 20MHz
  • EMI enhancement:
    • Programmable interface driving capability
  • Diagnostics:
    • Device thermal shutdown detection
    • Report interface option:
      • UART and interrupt pin (INT)
      • Two-wire output: CLK_O and SOUT
  • AEC-Q100 qualified for automotive applications:
    • Device temperature grade 1: –40°C to +125°C, TA
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B
  • Functional Safety-Capable:
    • Documentation available to aid functional safety system design
  • Full array local dimming topology:

    • Support up to 1024 devices cascaded

  • Operating voltage VCC range: 3V to 5.5V
  • Flexible P-MOSFET driving options:
    • Maximum channel current / voltage:
      • 30mA / 20V: TLC69600-Q1
      • 60mA / 20V: TLC69610-Q1
      • 30mA / 50V: TLC69650-Q1
      • 60mA / 50V: TLC69660-Q1
    • Global 8-bit Maximum Current (MC) setting
    • Individual 8-bit Channel Current (CC) setting
  • High speed daisy chain interface:
    • I/O voltage compatible with: 1.8V / 3.3V
    • Data transfer rate: up to 20MHz
  • EMI enhancement:
    • Programmable interface driving capability
  • Diagnostics:
    • Device thermal shutdown detection
    • Report interface option:
      • UART and interrupt pin (INT)
      • Two-wire output: CLK_O and SOUT

TLC696x0-Q1 is a scan MOSFET controller compatible with current-sink driver TLC696x2/4/8-Q1 to achieve 2/4/8 time-multiplexing control. Each device integrates with 16 constant current sinks for up to 8 scan MOSFETs control. The device equips with ghost-cancellation function to eliminate upside ghosting.

To optimize system efficiency, the device is equipped with adaptive headroom voltage control scheme to directly control DC/DC. Only the FB pin from last device in serial chain should be connected to DC/DC to achieve simplified system layout. The device also integrates minimum brightness update latency, black insertion and VRR features to improve display quality.

TLC696x0-Q1 has three error flags: LED open detection (LOD), LED short detection (LSD) and thermal shutdown detection (TSD) for diagnostic. The device implements two options for readback including UART/INT and SOUT/CLK_O which is programmable by register.

TLC696x0-Q1 is a scan MOSFET controller compatible with current-sink driver TLC696x2/4/8-Q1 to achieve 2/4/8 time-multiplexing control. Each device integrates with 16 constant current sinks for up to 8 scan MOSFETs control. The device equips with ghost-cancellation function to eliminate upside ghosting.

To optimize system efficiency, the device is equipped with adaptive headroom voltage control scheme to directly control DC/DC. Only the FB pin from last device in serial chain should be connected to DC/DC to achieve simplified system layout. The device also integrates minimum brightness update latency, black insertion and VRR features to improve display quality.

TLC696x0-Q1 has three error flags: LED open detection (LOD), LED short detection (LSD) and thermal shutdown detection (TSD) for diagnostic. The device implements two options for readback including UART/INT and SOUT/CLK_O which is programmable by register.

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* Data sheet TLC696x0-Q1 Automotive Scan MOSFET Controller for TLC696x2/4/8-Q1 datasheet PDF | HTML 25 may 2023

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

TLC69661RTWEVM — Módulo de evaluación TLC69661 para controlador LED de retroiluminación con atenuación local de 16 ca

El TLC69661EVM ayuda al usuario a evaluar las características del controlador LED de retroiluminación con atenuación local TLC69661 que integra 16 disipadores de corriente constante con SRAM para almacenamiento de brillo.
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
HTSSOP (PWP) 28 Ultra Librarian
WQFN (RTW) 24 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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