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Convertidores de datos
Convertidores digital-analógicos (DAC)
DAC de precisión (≤ 10 MSPS)

TLV5618A-EP

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Convertidor digital a analógico con apagado, producto mejorado

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TLV5618A-EP

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Detalles del producto

Resolution (bps) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5.5 INL (max) (±LSB) 4 Settling time (µs) 3 Reference type Ext Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.093 Power consumption (typ) (mW) 1.8 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
Resolution (bps) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5.5 INL (max) (±LSB) 4 Settling time (µs) 3 Reference type Ext Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.093 Power consumption (typ) (mW) 1.8 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Settling Time
    • 3 µs in Fast Mode
    • 10 µs in Slow Mode
  • Compatible With TMS320 and SPI Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • Direct Replacement for TLC5618A
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Settling Time
    • 3 µs in Fast Mode
    • 10 µs in Slow Mode
  • Compatible With TMS320 and SPI Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • Direct Replacement for TLC5618A
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.

The TLV5618A is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface is compatible with TMS320, SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a Class-AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed versus power dissipation.

Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package.

The TLV5618AM is characterized for operation from –55°C to 125°C.

The TLV5618A is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface is compatible with TMS320, SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a Class-AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed versus power dissipation.

Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package.

The TLV5618AM is characterized for operation from –55°C to 125°C.
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Documentación técnica

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Tipo Título Fecha
* Data sheet TLV5618A-EP: Digital-to-Aanalog Converter with Power Down datasheet 20 oct 2003
* VID TLV5618A-EP VID V6204646 21 jun 2016
* Radiation & reliability report TLV5618AMDREP Reliability Report (Rev. A) 05 abr 2012

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Herramienta de cálculo

ANALOG-ENGINEER-CALC — Calculadora para ingenieros analógicos

The analog engineer’s calculator is designed to speed up many of the repetitive calculations that analog circuit design engineers use on a regular basis. This PC-based tool provides a graphical interface with a list of various common calculations ranging from setting operational-amplifier (...)
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Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
Guía del usuario: PDF
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Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SOIC (D) 8 Ultra Librarian
Se aplican los Términos y condiciones estándar de TI para los elementos de evaluación.

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

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