AFE11612EVM

AFE11612-SEP evaluation module for 12-bit analog front end (AFE) with temperature sensors

AFE11612EVM

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Overview

The AFE11612EVM is an easy-to-use platform that evaluates the functionality and performance of the AFE11612‑SEP device. The AFE11612‑SEP is a highly-integrated, low-power, complete analog monitor and controller that includes a 16-channel (12-bit) analog-to-digital converter (ADC), 12-channel (12-bit) digital-to-analog converter (DAC), eight GPIOs, two remote temperature sensor channels, and one local temperature sensor channel. The device also features input out-of-range alarms, and a configurable serial interface supporting SPI and I2C protocols with 5-V and 3-V logic.

Features
  • 12 monotonic, 12-bit voltage output DACs
  • 16 channel, 12-bit, 500-kSPS SAR ADC
  • 8 GPIO pins
  • Internal 2.5-V reference
  • SPI and I2C interface: 2.7-V to 5.5-V operation
Integrated precision ADCs & DACs
AFE11612-SEP Radiation-tolerant 12-bit analog front end with temperature sensors and 12 DAC and 16 ADC channels
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Evaluation board

AFE11612EVM — AMC7812 Integrated Multichannel ADC and DAC for Analog Monitoring and Control Evaluation Module

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GUI for evaluation module (EVM)

AFE11612EVM-GUI — GUI for the AFE11612 evaluation module (EVM)

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AFE11612EVM-GUI GUI for the AFE11612 evaluation module (EVM)

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Latest version
Version: 1.0
Release date: 30 May 2024
lock AFE11612EVM-Installer.zip  — 349896 K

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Products
Integrated precision ADCs & DACs
AFE11612-SEP Radiation-tolerant 12-bit analog front end with temperature sensors and 12 DAC and 16 ADC channels
Hardware development
Evaluation board
AFE11612EVM AFE11612-SEP evaluation module for 12-bit analog front end (AFE) with temperature sensors

Release Infomation

Initial public release for AFE11612EVM GUI software installer

TI's Standard Terms and Conditions for Evaluation Items apply.

Technical documentation

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Type Title Date
EVM User's guide AFE11612 Evaluation Module User's Guide (Rev. A) PDF | HTML 03 Jun 2024
Certificate AFE11612EVM EU RoHS Declaration of Conformity (DoC) 01 Feb 2023

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