TIEVM-ARC-AFE
Analog front end for C2000™ MCU-based machine learning arc detection in solar applications
TIEVM-ARC-AFE
概要
The TIEVM-ARC-AFE is the orderable version of the TIDA-010955 reference design. The reference design features an analog front end for DC arc detection in solar applications based on artificial intelligence (AI). DC arcing induces a high-frequency noise onto the DC string current. To detect the arcing frequency, data is acquired and feed into an embedded AI model, which is trained to identify the arc. Compared to traditional arc detection approaches, this achieves higher accuracy with less computational efforts. In addition to the signal-chain for arc detection this design offers features for collecting and labeling arcing data for embedded AI model training. This hardware works with TMDSCNCD28P55X, controlCARD of C2000™ F28P55x devices, as well as other C2000 controlCARDs in 180-pin
特長
- 4-channel analog front end for AI-based arc detection
- Configurable analog front end with band-pass and notch filter
- String voltage and arc gap voltage measurement inputs for training data acquisition
- Auto-labeling circuits to generate labeled arcing data
- Works with TMDSCNCD28P55X, controlCARD of C2000 F28P55x devices, as well as other C2000 controlCARDs in 180-pin connector
- Selected embedded AI models for a quick start into AI-based arc detection
C2000 リアルタイム・マイコン
リニア・レギュレータと低ドロップアウト (LDO) レギュレータ
購入と開発の開始
TIEVM-ARC-AFE — TIEVM-ARC-AFE ソーラー アプリケーションで機械学習を使用してアークを検出する評価基板
技術資料
種類 | タイトル | 英語版のダウンロード | 日付 | |||
---|---|---|---|---|---|---|
設計ガイド | Analog Front End Reference Design for Machine Learning Arc Detection in Solar Applications (Rev. A) | PDF | HTML | 2024年 12月 5日 | |||
証明書 | DoC_EU RoHS_TIEVM-ARC-AFE | 2024年 10月 8日 |