4 Revision History
Changes from Revision H (February 2021) to Revision I (August 2021)
- Removed preview tag from TLV6742 VSSOP in Device Information
section Go
- Removed preview tag to VSSOP (DGK) in Device Comparison Table
sectionGo
Changes from Revision G (April 2020) to Revision H (February 2021)
- Updated the numbering format for tables, figures, and
cross-references throughout the documentGo
- Removed preview tag from TLV6742S X2QFN in Device Information
section Go
- Removed preview note from X2QFN for TLV6742S in Pin Configuration
and Functions sectionGo
- Removed Table of TLV6741 Graphs and Table of TLV6742 Graphs tables
from the Specifications sectionGo
- Removed Related Links section from the Device and
Documentation Support sectionGo
Changes from Revision F (January 2020) to Revision G (April 2020)
- Added end equipment links in Application
sectionGo
- Deleted preview tags for TSSOP, SOT-23, WSON, and X2QFN packages in Device
Information section Go
- Deleted VSSOP (8) package in Device Information section Go
- Added preview tag to TLV6742S X2QFN in Device Information
section Go
- Deleted VSSOP (DGK) in Device Comparison Table
sectionGo
- Added preview tag to X2QFN (RUG) in Device Comparison Table
sectionGo
- Deleted DGK package in pinout drawing for TLV6742 package in Pin
Configuration and Functions sectionGo
- Deleted DGK VSSOP in Thermal Information for Dual Channel
sectionGo
- Added shutdown electrical characteristic informationGo
- Deleted example layout for VSSOP-8 (DGK) package in Layout
Example sectionGo
Changes from Revision E (December 2019) to Revision F (January 2020)
- Deleted TLV6744 product folder link from the data sheet page headerGo
Changes from Revision D (January 2019) to Revision E (December 2019)
- Added IQ definition for TLV6742 and TLV744 in Features sectionGo
- Added EMIRR, Supply Range, IQ, and Offset Voltage Drift to Features sectionGo
- Changed Noise Spectral Density vs Frequency plot on front page to
the TLV6742 and TLV6744 noise plotGo
- Changed wording of Description section to incorporate release of TLV6742 and TLV6744 devices Go
- Changed TLV6742 packages in Device Information
Go
- Added Device Comparison Table sectionGo
- Added note regarding single supply operation to Pin Functions:
TLV6741 tableGo
- Added pin out drawings for TLV6742 packages in Pin Configuration
and Functions sectionGo
- Added pin functions for TLV6742 packagesGo
- Added X2QFN Package Drawing and Pin Functions for TLV6742S in Pin
Configuration and Functions sectionGo
- Added TLV6742 typical characteristic graphs in the
Specifications sectionGo
- Changed wording throughout Detailed Description section to incorporate addition of TLV6742 and TLV6744 devicesGo
- Added EMI Rejection section with description information to Detailed Description sectionGo
- Added Electrical Overstress section and diagram to Detailed Description sectionGo
- Added Typical Specification and Distributions section to Detailed Description sectionGo
- Added Shutdown Function section with description for TLV6742S to Detailed Description sectionGo
- Added Packages With an Exposed Thermal Pad section to Detailed Description sectionGo
- Changed wording in Application and Implementation section to include the addition of TLV6742 and TLV6744Go
- Added TLV6742 and TLV6744 information to Power Supply Recommendations sectionGo
- Added dual channel layout example in the Layout sectionGo
Changes from Revision C (October 2017) to Revision D (January 2019)
- Changed Operating temperature from 125 to 150 in Absolute Maximum Ratings
Go
- Added Junction temperature spec to Absolute Maximum Ratings
Go
Changes from Revision B (October 2017) to Revision C (October 2017)
- Added test conditions to input offset voltage parameter in Electrical Characteristics tableGo
- Changed typical input current noise density value from 2 fA√HZ to 23 fA√HzGo
- Changed total supply voltage total from 5V to 5.5V in Electrical Characteristics condition statementGo
- Deleted "Vs = 2.25 V to 5.5 V" test conditions for common-mode rejection ratio parameter in Electrical Characteristics
Go
- Deleted "CL = 0" test condition from Figure 7-25 and Figure 7-26, Figure 7-27 and Figure 7-28
Go
- Changed voltage step from 5 V to 2 V in Figure 7-32
Go
Changes from Revision A (September 2017) to Revision B (October 2017)
- Changed Human-body model (HBM) value from: ±1000 to ±3000 and Charged-device mode (CDM) value from ±250 to ±1000Go
Changes from Revision * (June 2017) to Revision A (September 2017)
- Changed device document status from: Advance Information to: Production DataGo
- Added Typical Characteristics
Go