Mapping Acceptable Control Measures to C2000 Unique Identifiers

The proposed mapping in this document is for reference. The system and equipment designer, or manufacturer, is responsible to ensure the end system meets the IEC 60730 / UL 1998 requirements.

Note: This section references IEC 60370 Annex H table H.1 and UL 1998 Appendix A table A.2 as they apply to microcontrollers. While these two tables are compatible, the exact wording may differ. For specific wording, clarifications, and definitions, see an original copy of the specifications.

The mapping is summarized the following tables:

Table 7 Acceptable Measure to Unique Identifier Mapping

Component	Section
CPU	CPU Related Faults
Interrupt related faults	Interrupt Related Faults
Clock faults	Clock Related Faults
Memory	Memory Related Faults
Internal data path faults	Internal Data Path Faults
Input and output periphery faults	Input/Output Related Faults
Other faults: external communication, monitoring devices, and custom chip faults	Communication, Monitoring Devices, and Custom Chip Faults

When reviewing the acceptable measure to Unique ID tables, reference the following documentation:

IEC 60730 / UL 1998 specifications:

Specific definitions of acceptable control measures for each class.
Additional acceptable control measures not listed here.
Clarifications and other notes not included here.

Device-specific Functional Safety Manual:

C2000 Unique ID definitions. Refer to the Summary of Safety Features and Diagnostics chapter for a short description and a link to a longer explanation with implementation guidance.
Supporting software.

Once done, do not forget to review the additional best practices described in Additional Best Practices.

Unique Identifier Reference includes a summary of Unique IDs referenced in this section. For further details, see the device-specific Functional Safety Manual.