SPRT759A October   2023  – June 2024 F29H850TU , F29H859TU-Q1 , TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4.   Introduction
  5.   Overview of IEC 60730 and UL 1998 Classifications
    1.     C2000 Capability by Device Family
  6.   C2000 Safety Collateral
    1.     Getting Started
    2.     Functional Safety Manuals
    3.     Software Collateral
  7.   Implementing Acceptable Measures on C2000 Real-Time MCUs
    1.     Implementation Steps
    2.     Example Mapping
    3.     Additional Best Practices
  8.   Mapping Acceptable Control Measures to C2000 Unique Identifiers
    1.     Unique Identifier Reference
    2.     CPU Related Faults
    3.     Interrupt Related Faults
    4.     Clock Related Faults
    5.     Memory Related Faults
    6.     Internal Data Path Faults
    7.     Input/Output Related Faults
    8.     Communication, Monitoring Devices, and Custom Chip Faults
  9.   Glossary
  10.   References

C2000 Capability by Device Family

The C2000 device capability in Table 3 is derived based on IEC 60730 example fault/error detection methods mapped to suggested device diagnostics and functional-safety features. This mapping is described in the remainder of this document.

Table 3 IEC 60730 / UL 1998 Capability per C2000 Device Family
Device Family Class B / 1 Class C / 2

F280013x

F280015x

F28002x
F28003x
F28004x
F2807x
F2837xD, F2837xS
F2838x