SBAA532A February   2022  – March 2024 ADS1119 , ADS1120 , ADS1120-Q1 , ADS112C04 , ADS112U04 , ADS1130 , ADS1131 , ADS114S06 , ADS114S06B , ADS114S08 , ADS114S08B , ADS1158 , ADS1219 , ADS1220 , ADS122C04 , ADS122U04 , ADS1230 , ADS1231 , ADS1232 , ADS1234 , ADS1235 , ADS1235-Q1 , ADS124S06 , ADS124S08 , ADS1250 , ADS1251 , ADS1252 , ADS1253 , ADS1254 , ADS1255 , ADS1256 , ADS1257 , ADS1258 , ADS1258-EP , ADS1259 , ADS1259-Q1 , ADS125H01 , ADS125H02 , ADS1260 , ADS1260-Q1 , ADS1261 , ADS1261-Q1 , ADS1262 , ADS1263 , ADS127L01 , ADS130E08 , ADS131A02 , ADS131A04 , ADS131E04 , ADS131E06 , ADS131E08 , ADS131E08S , ADS131M02 , ADS131M03 , ADS131M04 , ADS131M06 , ADS131M08

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Bridge Overview
  5. 2Bridge Construction
    1. 2.1 Active Elements in Bridge Topologies
      1. 2.1.1 Bridge With One Active Element
        1. 2.1.1.1 Reducing Non-Linearity in a Bridge With One Active Element Using Current Excitation
      2. 2.1.2 Bridge With Two Active Elements in Opposite Branches
        1. 2.1.2.1 Eliminating Non-Linearity in a Bridge With Two Active Elements in Opposite Branches Using Current Excitation
      3. 2.1.3 Bridge With Two Active Elements in the Same Branch
      4. 2.1.4 Bridge With Four Active Elements
    2. 2.2 Strain Gauge and Bridge Construction
  6. 3Bridge Connections
    1. 3.1 Ratiometric Measurements
    2. 3.2 Four-Wire Bridge
    3. 3.3 Six-Wire Bridge
  7. 4Electrical Characteristics of Bridge Measurements
    1. 4.1 Bridge Sensitivity
    2. 4.2 Bridge Resistance
    3. 4.3 Output Common-Mode Voltage
    4. 4.4 Offset Voltage
    5. 4.5 Full-Scale Error
    6. 4.6 Non-Linearity Error and Hysteresis
    7. 4.7 Drift
    8. 4.8 Creep and Creep Recovery
  8. 5Signal Chain Design Considerations
    1. 5.1 Amplification
      1. 5.1.1 Instrumentation Amplifier
        1. 5.1.1.1 INA Architecture and Operation
        2. 5.1.1.2 INA Error Sources
      2. 5.1.2 Integrated PGA
        1. 5.1.2.1 Integrated PGA Architecture and Operation
        2. 5.1.2.2 Benefits of Using an Integrated PGA
    2. 5.2 Noise
      1. 5.2.1 Noise in an ADC Data Sheet
      2. 5.2.2 Calculating NFC for a Bridge Measurement System
    3. 5.3 Channel Scan Time and Signal Bandwidth
      1. 5.3.1 Noise Performance
      2. 5.3.2 ADC Conversion Latency
      3. 5.3.3 Digital Filter Frequency Response
    4. 5.4 AC Excitation
    5. 5.5 Calibration
      1. 5.5.1 Offset Calibration
      2. 5.5.2 Gain Calibration
      3. 5.5.3 Calibration Example
  9. 6Bridge Measurement Circuits
    1. 6.1 Four-Wire Resistive Bridge Measurement with a Ratiometric Reference and a Unipolar, Low-Voltage (≤5 V) Excitation Source
      1. 6.1.1 Schematic
      2. 6.1.2 Pros and Cons
      3. 6.1.3 Parameters and Variables
      4. 6.1.4 Design Notes
      5. 6.1.5 Measurement Conversion
      6. 6.1.6 Generic Register Settings
    2. 6.2 Six-Wire Resistive Bridge Measurement With a Ratiometric Reference and a Unipolar, Low-Voltage (≤ 5 V) Excitation Source
      1. 6.2.1 Schematic
      2. 6.2.2 Pros and Cons
      3. 6.2.3 Parameters and Variables
      4. 6.2.4 Design Notes
      5. 6.2.5 Measurement Conversion
      6. 6.2.6 Generic Register Settings
    3. 6.3 Four-Wire Resistive Bridge Measurement With a Pseudo-Ratiometric Reference and a Unipolar, High-Voltage (> 5 V) Excitation Source
      1. 6.3.1 Schematic
      2. 6.3.2 Pros and Cons
      3. 6.3.3 Parameters and Variables
      4. 6.3.4 Design Notes
      5. 6.3.5 Measurement Conversion
      6. 6.3.6 Generic Register Settings
    4. 6.4 Four-Wire Resistive Bridge Measurement with a Pseudo-Ratiometric Reference and Asymmetric, High-Voltage (> 5 V) Excitation Source
      1. 6.4.1 Schematic
      2. 6.4.2 Pros and Cons
      3. 6.4.3 Parameters and Variables
      4. 6.4.4 Design Notes
      5. 6.4.5 Measurement Conversion
      6. 6.4.6 Generic Register Settings
    5. 6.5 Four-Wire Resistive Bridge Measurement With a Ratiometric Reference and Current Excitation
      1. 6.5.1 Schematic
      2. 6.5.2 Pros and Cons
      3. 6.5.3 Parameters and Variables
      4. 6.5.4 Design Notes
      5. 6.5.5 Measurement Conversion
      6. 6.5.6 Generic Register Settings
    6. 6.6 Measuring Multiple Four-Wire Resistive Bridges in Series with a Pseudo-Ratiometric Reference and a Unipolar, Low-Voltage (≤5V) Excitation Source
      1. 6.6.1 Schematic
      2. 6.6.2 Pros and Cons
      3. 6.6.3 Parameters and Variables
      4. 6.6.4 Design Notes
      5. 6.6.5 Measurement Conversion
      6. 6.6.6 Generic Register Settings
    7. 6.7 Measuring Multiple Four-Wire Resistive Bridges in Parallel Using a Single-Channel ADC With a Ratiometric Reference and a Unipolar, Low-Voltage (≤ 5 V) Excitation Source
      1. 6.7.1 Schematic
      2. 6.7.2 Pros and Cons
      3. 6.7.3 Parameters and Variables
      4. 6.7.4 Design Notes
      5. 6.7.5 Measurement Conversion
      6. 6.7.6 Generic Register Settings
    8. 6.8 Measuring Multiple Four-Wire Resistive Bridges in Parallel Using a Multichannel ADC With a Ratiometric Reference and a Unipolar, Low-Voltage (≤ 5 V) Excitation Source
      1. 6.8.1 Schematic
      2. 6.8.2 Pros and Cons
      3. 6.8.3 Parameters and Variables
      4. 6.8.4 Design Notes
      5. 6.8.5 Measurement Conversion
      6. 6.8.6 Generic Register Settings
  10. 7Summary
  11. 8Revision History

5.5.2 Gain Calibration

After completing offset calibration, correct any gain error by first applying a calibrated test load to the system. For example, a weigh scale would use a calibrated weight. This test load does not necessarily need to be the maximum load of the measurement system. Instead, the test load should be large enough to accurately determine the slope of the bridge measurement response over the target measurement range. Typically, choosing a test load that is 80% or more of the target measurement range is sufficient. A scaling factor relative to the slope of the bridge measurement response is then stored in the microcontroller as the gain calibration coefficient. Similar to offset calibration, gain calibration measurements have noise that can be reduced by averaging multiple ADC samples.

Figure 5-14 illustrates how measuring the test load helps identify a gain error between the blue plot (offset calibration only) and the green, ideal response.

GUID-20211110-SS0I-XTKN-VWGX-PWLWFCP8QLDM-low.svg Figure 5-14 Gain Calibration Calculates the Scaling Factor (MActual) from the Test Load

The gain calibration in Figure 5-14 identifies the slope of the blue curve, MActual, using the test load as a reference. A scaling factor, M, related to MActual is then stored in a microcontroller similar to the block diagram in Figure 5-12. This value of M as well as BActual from the offset calibration are used to accurately determine the value of any arbitrary applied load: first, subtract BActual from the measured ADC code; and second, multiply the result by M.

While this simple, two-point calibration process accounts for the majority of the DC error seen in a bridge measurement, it does not account for non-linearity or drift. A piecewise calibration can be used to account for these errors, though this requires many measurements across the full input span and temperature range (see Section 5.5). However, these errors are typically small and are often accounted for in the design error budget.