SBAA607A December   2023  – January 2024 AM2631 , AM2631-Q1 , AM2632 , AM2632-Q1 , AM2634 , AM2634-Q1 , AM263P2 , AM263P4 , AM263P4-Q1 , AMC1303M2520 , AMC1305L25 , AMC1306M25 , F29H850TU , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Design Challenge With Digital Interface Timing Specifications
  6. 3Design Approach With Clock Edge Delay Compensation
    1. 3.1 Clock Signal Compensation With Software Configurable Phase Delay
    2. 3.2 Clock Signal Compensation With Hardware Configurable Phase Delay
    3. 3.3 Clock Signal Compensation by Clock Return
    4. 3.4 Clock Signal Compensation by Clock Inversion at the MCU
  7. 4Test and Validation
    1. 4.1 Test Equipment and Software
    2. 4.2 Testing of Clock Signal Compensation With Software Configurable Phase Delay
      1. 4.2.1 Test Setup
      2. 4.2.2 Test Measurement Results
    3. 4.3 Testing of Clock Signal Compensation by Clock Inversion at MCU
      1. 4.3.1 Test Setup
      2. 4.3.2 Test Measurement Results
        1. 4.3.2.1 Test Result – No Clock Inversion of Clock Input at GPIO123
        2. 4.3.2.2 Test Result – Clock Inversion of Clock Input at GPIO123
    4. 4.4 Digital Interface Timing Validation by Calculation Tool
      1. 4.4.1 Digital Interface With No Compensation Method
      2. 4.4.2 Commonly Used Method - Reduction of the Clock Frequency
      3. 4.4.3 Clock Edge Compensation With Software Configurable Phase Delay
  8. 5Conclusion
  9. 6References
  10. 7Revision History

4 Test and Validation

The following sections present clock edge compensation test results using an additional clock signal with phase delay in software as described in Section 3.1 as well as clock inversion as described in Section 3.4. First, the test equipment and software are described, followed by the test setup, measurements and test results of the clock signal compensation methods.