SPRUHZ7K August 2015 – April 2024 AM5706 , AM5708 , AM5716 , AM5718 , AM5718-HIREL
Address Offset | 0x0000 000C | ||
Physical Address | Instance | ||
Description | Functional Configuration registers | ||
Type | RW |
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
MEM_INVPAIR | RESERVED |
Bits | Field Name | Description | Type | Reset |
---|---|---|---|---|
31 | MEM_INVPAIR | Invert polarity of TXP/TXN | RW | 0 |
30:0 | RESERVED | R | 0x0000 0000 |
Address Offset | 0x0000 002C | ||
Physical Address | Instance | ||
Description | Test related configuration registers | ||
Type | RW |
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | MEM_EN_LPBK | MEM_ENTXPATT | MEM_TESTPATT | RESERVED |
Bits | Field Name | Description | Type | Reset |
---|---|---|---|---|
31 | RESERVED | RW | 0 | |
30 | MEM_EN_LPBK | Loopback enable for test | RW | 0 |
29 | MEM_ENTXPATT | Enable Test pattern to input of the serializer instead of TD | RW | 0 |
28:26 | MEM_TESTPATT | Select the LFSR mode to generate the required pattern 000=> 31 bit LFSR mode 011 => 23 bit LFSR mode 010 => 7 bit LFSR mode 001=> generate 1010 pattern 100=> Fixed 31 bit value from PATTGEN_PRELOAD_VAL | RW | 0x0 |
25:0 | RESERVED | RW | 0x00 0000 |
Address Offset | 0x0000 0030 | ||
Physical Address | Instance | ||
Description | Pattern generator (31 bit) LFSR Seed or preload value | ||
Type | RW |
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
MEM_PATTGEN_PRELOAD_VAL | RESERVED |
Bits | Field Name | Description | Type | Reset |
---|---|---|---|---|
31:1 | MEM_PATTGEN_PRELOAD_VAL | Preload value to the LFSR pattern generator | RW | 0x0000 0000 |
0 | RESERVED | RW | 0 |