Product details

Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 36 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 25 VICR (max) (V) 0 VICR (min) (V) 34.5 TI functional safety category Functional Safety-Capable
Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 36 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 25 VICR (max) (V) 0 VICR (min) (V) 34.5 TI functional safety category Functional Safety-Capable
SOIC (D) 8 29.4 mm² 4.9 x 6 SOT-23-THN (DDF) 8 8.12 mm² 2.9 x 2.8 TSSOP (PW) 8 19.2 mm² 3 x 6.4 VSSOP (DGK) 8 14.7 mm² 3 x 4.9 WSON (DSG) 8 4 mm² 2 x 2
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200uA typical per comparator ("B" Versions)
  • Low input bias current 3.5nA typical ("B" device)
  • Low input offset current 0.5nA typical ("B" device)
  • Low input offset voltage ±0.37mV typical ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200uA typical per comparator ("B" Versions)
  • Low input bias current 3.5nA typical ("B" device)
  • Low input offset current 0.5nA typical ("B" device)
  • Low input offset voltage ±0.37mV typical ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2V to 36V, and VCC is at least 1.5V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2V to 36V, and VCC is at least 1.5V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.

Download View video with transcript Video

Similar products you might be interested in

open-in-new Compare alternates
Drop-in replacement with upgraded functionality to the compared device
TLV1822-Q1 ACTIVE Automotive, dual, micropower high-voltage open-drain comparator Upgraded rail-to-rail device with wider voltage range and improved power consumption, propagation delay and offset voltage
Pin-for-pin with same functionality to the compared device
LM393LV-Q1 ACTIVE Automotive low-voltage commodity comparator Alternative for lower voltage range with improved performance: lower power, lower offset voltage and faster speed

Technical documentation

star =Top documentation for this product selected by TI
No results found. Please clear your search and try again.
View all 3
Type Title Date
* Data sheet LM2903-Q1 and LM2903B-Q1 Automotive Dual Comparators datasheet (Rev. M) PDF | HTML 13 Dec 2024
Application note Application Design Guidelines for LM339, LM393, TL331 Family Comparators Including the New B-versions (Rev. F) PDF | HTML 12 Dec 2024
Functional safety information LM2903B-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA (Rev. A) PDF | HTML 11 Jan 2022

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

AMP-PDK-EVM — Amplifier performance development kit evaluation module

The amplifier performance development kit (PDK) is an evaluation module (EVM) kit to test common operational amplifier (op amp) parameters and is compatible with most op amps and comparators. The EVM kit offers a main board with several socketed daughtercard options to fit package needs, allowing (...)

User guide: PDF | HTML
Evaluation board

DIP-ADAPTER-EVM — DIP adapter evaluation module

Speed up your op amp prototyping and testing with the DIP adapter evaluation module (DIP-ADAPTER-EVM), which provides a fast, easy and inexpensive way to interface with small surface-mount ICs. You can connect any supported op amp using the included Samtec terminal strips or wire them (...)

User guide: PDF
Not available on TI.com
Evaluation board

DUAL-DIYAMP-EVM — Dual-channel universal do-it-yourself (DIY) amplifier circuit evaluation module

The DUAL-DIYAMP-EVM is an evaluation module (EVM) family that provides engineers and do it yourselfers (DIYers) with real-world amplifier circuits, enabling quick evaluation of design concepts and verify simulations. It is designed specifically for dual package op amps in the (...)

User guide: PDF
Not available on TI.com
Evaluation board

SMALL-AMP-DIP-EVM — Evaluation module for operational amplifiers with small-size packages

The SMALL-AMP-DIP-EVM speeds up small-package operational-amplifier prototyping by providing a fast and easy way to interface with many industry-standard small-size packages. SMALL-AMP-DIP-EVM supports eight small package options including DPW-5 (X2SON), DSG-8 (WSON), DCN-8 (SOT), DDF-8 (...)

User guide: PDF
Not available on TI.com
Simulation model

LM2903B PSpice Model (Rev. E)

SLCJ011E.ZIP (46 KB) - PSpice Model
Simulation model

LM2903B TINA-TI Spice Model (Rev. B)

SLCM014B.ZIP (10 KB) - TINA-TI Spice Model
Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Simulation tool

TINA-TI — SPICE-based analog simulation program

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
User guide: PDF
Reference designs

TIDA-010249 — Four-channel synchronous vibration sensor interface reference design

This reference design explains the theory, design and testing of a synchronous, four-channel wideband high-resolution interface. The main targets are the vibration sensing applications, but the design can also be applied to any application that requires wideband, such as three-phase voltage and (...)
Design guide: PDF
Package Pins CAD symbols, footprints & 3D models
SOIC (D) 8 Ultra Librarian
SOT-23-THN (DDF) 8 Ultra Librarian
TSSOP (PW) 8 Ultra Librarian
VSSOP (DGK) 8 Ultra Librarian
WSON (DSG) 8 Ultra Librarian

Ordering & quality

Information included:
  • RoHS
  • REACH
  • Device marking
  • Lead finish/Ball material
  • MSL rating/Peak reflow
  • MTBF/FIT estimates
  • Material content
  • Qualification summary
  • Ongoing reliability monitoring
Information included:
  • Fab location
  • Assembly location

Recommended products may have parameters, evaluation modules or reference designs related to this TI product.

Support & training

TI E2E™ forums with technical support from TI engineers

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support. ​​​​​​​​​​​​​​

Videos