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LF298

ACTIVO

Circuito de retención y muestra monolítico (adquisición de 10 µs, desplazamiento de 3 mV)

Detalles del producto

Rating Catalog Operating temperature range (°C) -25 to 85
Rating Catalog Operating temperature range (°C) -25 to 85
SOIC (D) 14 51.9 mm² 8.65 x 6
  • Operates from ±5-V to ±18-V Supplies
  • Less than 10-µs Acquisition Time
  • Logic Input Compatible With TTL, PMOS, CMOS
  • 0.5-mV Typical Hold Step at Ch = 0.01 µF
  • Low Input Offset
  • 0.002% Gain Accuracy
  • Low Output Noise in Hold Mode
  • Input Characteristics Do Not Change During Hold Mode
  • High Supply Rejection Ratio in Sample or Hold
  • Wide Bandwidth
  • Space Qualified, JM38510
  • Operates from ±5-V to ±18-V Supplies
  • Less than 10-µs Acquisition Time
  • Logic Input Compatible With TTL, PMOS, CMOS
  • 0.5-mV Typical Hold Step at Ch = 0.01 µF
  • Low Input Offset
  • 0.002% Gain Accuracy
  • Low Output Noise in Hold Mode
  • Input Characteristics Do Not Change During Hold Mode
  • High Supply Rejection Ratio in Sample or Hold
  • Wide Bandwidth
  • Space Qualified, JM38510

The LFx98x devices are monolithic sample-and-hold circuits that use BI-FET technology to obtain ultrahigh DC accuracy with fast acquisition of signal and low droop rate. Operating as a unity-gain follower, DC gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin and does not degrade input offset drift. The wide bandwidth allows the LFx98x to be included inside the feedback loop of 1-MHz operational amplifiers without having stability problems. Input impedance of 1010 Ω allows high-source impedances to be used without degrading accuracy.

P-channel junction FETs are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1-µF hold capacitor. The JFETs have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design ensures no feedthrough from input to output in the hold mode, even for input signals equal to the supply voltages.

Logic inputs on the LFx98x are fully differential with low input current, allowing for direct connection to TTL, PMOS, and CMOS. Differential threshold is
1.4 V. The LFx98x will operate from ±5-V to ±18-V supplies.

An A version is available with tightened electrical specifications.

The LFx98x devices are monolithic sample-and-hold circuits that use BI-FET technology to obtain ultrahigh DC accuracy with fast acquisition of signal and low droop rate. Operating as a unity-gain follower, DC gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin and does not degrade input offset drift. The wide bandwidth allows the LFx98x to be included inside the feedback loop of 1-MHz operational amplifiers without having stability problems. Input impedance of 1010 Ω allows high-source impedances to be used without degrading accuracy.

P-channel junction FETs are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1-µF hold capacitor. The JFETs have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design ensures no feedthrough from input to output in the hold mode, even for input signals equal to the supply voltages.

Logic inputs on the LFx98x are fully differential with low input current, allowing for direct connection to TTL, PMOS, and CMOS. Differential threshold is
1.4 V. The LFx98x will operate from ±5-V to ±18-V supplies.

An A version is available with tightened electrical specifications.

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Documentación técnica

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* Data sheet LFx98x Monolithic Sample-and-Hold Circuits datasheet (Rev. C) PDF | HTML 05 oct 2018

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

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