Detalles del producto

Technology family TTL Number of channels 1 Operating temperature range (°C) 0 to 70 Rating Catalog Supply current (max) (µA) 70000
Technology family TTL Number of channels 1 Operating temperature range (°C) 0 to 70 Rating Catalog Supply current (max) (µA) 70000
PDIP (N) 16 181.42 mm² 19.3 x 9.4
  • '46A, '47A, 'LS47 feature
    • Open-Collector Outputs Drive Indicators Directly
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • '48, 'LS48 feature
    • Internal Pull-Ups Eliminate Need for External Resistors
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • 'LS49 feature
    • Open-Collector Outputs
    • Blanking Input
  • All Circuit Types Feature Lamp Intensity Modulation Capability
  • '46A, '47A, 'LS47 feature
    • Open-Collector Outputs Drive Indicators Directly
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • '48, 'LS48 feature
    • Internal Pull-Ups Eliminate Need for External Resistors
    • Lamp-Test Provision
    • Leading/Trailing Zero Suppression
  • 'LS49 feature
    • Open-Collector Outputs
    • Blanking Input
  • All Circuit Types Feature Lamp Intensity Modulation Capability

The '46A, '47A, and 'LS47 feature active-low outputs designed for driving, common-anode LEDs or incandescent indicators directly. The '48, 'LS48, and 'LS49 feature active-high outputs for driving lamp buffers or common-cathode LEDs. All of the circuits except 'LS49 have full ripple-blanking input/output controls and a lamp test input. The 'LS49 circuit incorporates a direct blanking input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

The '46A, '47A, '48, 'LS47, and 'LS48 circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types (including the '49 and 'LS49) contain an overriding blanking input (BI\), which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

The SN54246/SN74246 and '247 and the SN54LS247/SN74LS247 and 'LS248 compose the 6 and the 9 with tails and were designed to offer the designer a choice between two indicator fonts.

The '46A, '47A, and 'LS47 feature active-low outputs designed for driving, common-anode LEDs or incandescent indicators directly. The '48, 'LS48, and 'LS49 feature active-high outputs for driving lamp buffers or common-cathode LEDs. All of the circuits except 'LS49 have full ripple-blanking input/output controls and a lamp test input. The 'LS49 circuit incorporates a direct blanking input. Segment identification and resultant displays are shown below. Display patterns for BCD input counts above 9 are unique symbols to authenticate input conditions.

The '46A, '47A, '48, 'LS47, and 'LS48 circuits incorporate automatic leading and/or trailing-edge zero-blanking control (RBI\ and RBO\). Lamp test (LT\) of these types may be performed at any time when the BI\/RBO\ node is at a high level. All types (including the '49 and 'LS49) contain an overriding blanking input (BI\), which can be used to control the lamp intensity by pulsing or to inhibit the outputs. Inputs and outputs are entirely compatible for use with TTL logic outputs.

The SN54246/SN74246 and '247 and the SN54LS247/SN74LS247 and 'LS248 compose the 6 and the 9 with tails and were designed to offer the designer a choice between two indicator fonts.

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Documentación técnica

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Tipo Título Fecha
* Data sheet BCD-to-Seven-Segment Decoders/Drivers datasheet 01 mar 1988
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
Application note Designing With Logic (Rev. C) 01 jun 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 oct 1996
Application note Live Insertion 01 oct 1996

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

14-24-LOGIC-EVM — Módulo de evaluación genérico de productos lógicos para encapsulados D, DB, DGV, DW, DYY, NS y PW de

El módulo de evaluación 14-24-LOGIC-EVM (EVM) está diseñado para admitir cualquier dispositivo lógico que esté en un encapsulado D, DW, DB, NS, PW, DYY o DGV de 14 a 24 pines.

Guía del usuario: PDF | HTML
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
PDIP (N) 16 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

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