TLV1H103-SEP

ACTIVO

Comparador monocanal de 2.5 ns tolerante a la radiación con salidas de pulsación-tracción

Detalles del producto

Number of channels 1 Output type Push-Pull Propagation delay time (µs) 0.0025 Vs (max) (V) 5.5 Vs (min) (V) 2.4 Rating Space Features Adjustable Hysteresis, Latch, POR Iq per channel (typ) (mA) 5.7 Vos (offset voltage at 25°C) (max) (mV) 7 Rail-to-rail In Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 5000 VICR (max) (V) 5.7 VICR (min) (V) -0.2
Number of channels 1 Output type Push-Pull Propagation delay time (µs) 0.0025 Vs (max) (V) 5.5 Vs (min) (V) 2.4 Rating Space Features Adjustable Hysteresis, Latch, POR Iq per channel (typ) (mA) 5.7 Vos (offset voltage at 25°C) (max) (mV) 7 Rail-to-rail In Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 5000 VICR (max) (V) 5.7 VICR (min) (V) -0.2
SOT-23 (DBV) 6 8.12 mm² 2.9 x 2.8
  • VID V62/22606-01XE

  • Radiation - Total Ionizing Dose (TID)

    • TID Characterized to 30krad (Si)

    • ELDRS-Free to 30krad (Si)

    • RHA/RLAT to 30krad (Si)

  • Radiation - Single-Event Effects (SEE)

    • SEL Immune to LET = 43MeV·cm2/mg

    • SET Characterized to LET = 43MeV·cm2/mg

  • Space Enhanced Plastic

    • Controlled Baseline

    • One Assembly/Test Site

    • One Fabrication Site

    • Extended Product Life Cycle

    • Product Traceability

  • Low propagation delay: 2.5ns
  • Low overdrive dispersion: 700ps
  • High toggle frequency: 325MHz
  • Narrow pulse width detection capability: 1.5ns
  • Input common-mode range extends 200mV beyond both rails
  • Supply range: 2.4V to 5.5V
  • Adjustable hysteresis control
  • Output latch capability
  • VID V62/22606-01XE

  • Radiation - Total Ionizing Dose (TID)

    • TID Characterized to 30krad (Si)

    • ELDRS-Free to 30krad (Si)

    • RHA/RLAT to 30krad (Si)

  • Radiation - Single-Event Effects (SEE)

    • SEL Immune to LET = 43MeV·cm2/mg

    • SET Characterized to LET = 43MeV·cm2/mg

  • Space Enhanced Plastic

    • Controlled Baseline

    • One Assembly/Test Site

    • One Fabrication Site

    • Extended Product Life Cycle

    • Product Traceability

  • Low propagation delay: 2.5ns
  • Low overdrive dispersion: 700ps
  • High toggle frequency: 325MHz
  • Narrow pulse width detection capability: 1.5ns
  • Input common-mode range extends 200mV beyond both rails
  • Supply range: 2.4V to 5.5V
  • Adjustable hysteresis control
  • Output latch capability

The TLV1H103-SEP is a 325MHz, high speed comparator with rail-to-rail inputs and a propagation delay of 2.5ns. The combination of fast response and wide operating voltage range make the comparator an excellent choice for narrow signal pulse detection and data and clock recovery applications in radar imaging and communications payload systems.

The push-pull (single-ended) outputs of the TLV1H103-SEP simplify and save cost on board-to-board wiring for I/O interfaces while reducing power consumption when compared to alternative high-speed differential output comparators. In addition, the TLV1H103-SEP offers the features such as adjustable hysteresis control and output latch capability. The comparator can directly interface most prevailing digital controllers and IO expanders in the downstream.

The TLV1H103-SEP uses a high-speed complementary BiCMOS process and is available in a 6-pin, SOT-23 package.

The TLV1H103-SEP is a 325MHz, high speed comparator with rail-to-rail inputs and a propagation delay of 2.5ns. The combination of fast response and wide operating voltage range make the comparator an excellent choice for narrow signal pulse detection and data and clock recovery applications in radar imaging and communications payload systems.

The push-pull (single-ended) outputs of the TLV1H103-SEP simplify and save cost on board-to-board wiring for I/O interfaces while reducing power consumption when compared to alternative high-speed differential output comparators. In addition, the TLV1H103-SEP offers the features such as adjustable hysteresis control and output latch capability. The comparator can directly interface most prevailing digital controllers and IO expanders in the downstream.

The TLV1H103-SEP uses a high-speed complementary BiCMOS process and is available in a 6-pin, SOT-23 package.

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Documentación técnica

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Tipo Título Fecha
* Data sheet TLV1H103-SEP Radiation Tolerant High-Speed Comparator with 2.5ns Propagation Delay datasheet PDF | HTML 14 ago 2024
* VID TLV1H103-SEP VID V62/22606 16 dic 2024
* Radiation & reliability report TLV1H103-SEP Radiation Tolerant High-Speed Comparator TID Report (Rev. B) 14 ago 2024
* Radiation & reliability report TLV1H103-SEP Production Flow and Reliability Report PDF | HTML 12 ago 2024
* Radiation & reliability report TLV1H103-SEP Neutron Displacement Damage (NDD) Characterization Report 29 abr 2024
* Radiation & reliability report TLV1H103-SEP Single-Event Effects (SEE) Radiation Report PDF | HTML 26 abr 2024
Certificate HS-COMPARATOR-EVM EU Declaration of Conformity (DoC) 08 abr 2024

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Modelo de simulación

TLV1H103-SEP PSpice Model

SNOM799.ZIP (269 KB) - PSpice Model
Modelo de simulación

TLV1H103-SEP TINA-TI Model

SNOM798.ZIP (0 KB) - TINA-TI Spice Model
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
Guía del usuario: PDF
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SOT-23 (DBV) 6 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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