DAC5672-EP
- Controlled Baseline
- One Assembly
- One Test Site
- One Fabrication Site
- Extended Temperature Performance of -55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree(1)
- 14-Bit Dual Transmit Digital-to-Analog Converter (DAC)
- 200-MSPS Update Rate
- Single Supply: 3 V to 3.6 V
- High Spurious-Free Dynamic Range (SFDR): 84 dBc at 5 MHz
- High Third-Order Two-Tone Intermodulation (IMD3): 79 dBc at 15.1 MHz and 16.1 MHz
- WCDMA Adjacent Channel Leakage Ratio (ACLR): 78 dB at Baseband
- WCDMA ACLR: 73 dB at 30.72 MHz
- Independent or Single Resistor Gain Control
- Dual or Interleaved Data
- On-Chip 1.2-V Reference
- Low Power: 330 mW
- Power-Down Mode: 9 mW
- Package: 48-Pin Thin-Quad Flat Pack (TQFP)
- APPLICATIONS
- Cellular Base Transceiver Station Transmit Channel
- CDMA: W-CDMA, CDMA2000, IS-95
- TDMA: GSM, IS-136, EDGE/UWC-136
- Medical/Test Instrumentation
- Arbitrary Waveform Generators (ARB)
- Direct Digital Synthesis (DDS)
- Cable Modem Termination System (CMTS)
- Cellular Base Transceiver Station Transmit Channel
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
The DAC5672 is a monolithic, dual-channel, 14-bit, high-speed digital-to-analog converter (DAC) with on-chip voltage reference.
Operating with update rates of up to 200 MSPS, the DAC5672 offers exceptional dynamic performance, tight gain, and offset matching characteristics that make it suitable in either I/Q baseband or direct IF communication applications.
Each DAC has a high-impedance, differential-current output, suitable for single-ended or differential analog-output configurations. External resistors allow scaling the full-scale output current for each DAC separately or together, typically between 2 mA and 20 mA. An accurate on-chip voltage reference is temperature compensated and delivers a stable 1.2-V reference voltage. Optionally, an external reference may be used.
The DAC5672 has two 14-bit parallel input ports with separate clocks and data latches. For flexibility, the DAC5672 also supports multiplexed data for each DAC on one port when operating in the interleaved mode.
The DAC5672 has been specifically designed for a differential transformer-coupled output with a 50- doubly-terminated load. For a 20-mA full-scale output current, both a 4:1 impedance ratio (resulting in an output power of 4 dBm) and 1:1 impedance ratio transformer (-2 dBm output power) are supported.
The DAC5672 is available in a 48-pin thin quad flat pack (TQFP) package. Pin compatibility between family members provides 12-bit (DAC5662) and 14-bit (DAC5672) resolution. Furthermore, the DAC5672 is pin compatible to the DAC2904 and AD9767 dual DACs. The device is characterized for operation over the military temperature range of -55°C to 125°C.
技術資料
種類 | タイトル | 最新の英語版をダウンロード | 日付 | |||
---|---|---|---|---|---|---|
* | データシート | DAC5672-EP データシート (Rev. A) | 2006年 10月 10日 | |||
* | VID | DAC5672-EP VID V6206639 | 2016年 6月 21日 | |||
アプリケーション・ノート | High Speed, Digital-to-Analog Converters Basics (Rev. A) | 2012年 10月 23日 | ||||
アプリケーション・ノート | 高速データ変換 | 英語版 | 2009年 12月 11日 | |||
アプリケーション・ノート | データ・コンバータのドリフトに関する設計者の必須知識: 最悪劣化度の構成要素を理解して仕様の条件を減らす | 2009年 4月 22日 | ||||
アプリケーション・ノート | CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters | 2008年 6月 8日 | ||||
アプリケーション・ノート | Phase Noise Performance and Jitter Cleaning Ability of CDCE72010 | 2008年 6月 2日 |
設計および開発
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パッケージ | ピン数 | CAD シンボル、フットプリント、および 3D モデル |
---|---|---|
TQFP (PFB) | 48 | Ultra Librarian |
購入と品質
- RoHS
- REACH
- デバイスのマーキング
- リード端子の仕上げ / ボールの原材料
- MSL 定格 / ピーク リフロー
- MTBF/FIT 推定値
- 使用原材料
- 認定試験結果
- 継続的な信頼性モニタ試験結果
- ファブの拠点
- 組み立てを実施した拠点