封裝資訊
| 封裝 | 針腳 TSSOP (PW) | 20 |
| 操作溫度範圍 (°C) -55 to 125 |
| 包裝數量 | 運送業者 250 | SMALL T&R |
SN54SC245-SEP 的特色
- Vendor item drawing available, VID V62/23616
- Total ionizing dose characterized at 30 krad(Si)
- Total ionizing dose characterized radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad(Si)
- Single-event effects (SEE) characterized:
- Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
- Single event transient (SET) characterized to 43 MeV-cm2 /mg
- Wide operating range of 1.2 V to 5.5 V
- 5.5 V tolerant input pins
- Output drive up to 25 mA at 5-V
- Latch-up performance exceeds 250 mA per JESD 17
- Space enhanced plastic (SEP)
- Controlled baseline
- Gold bondwire
- NiPdAu lead finish
- One assembly and test site
- One fabrication site
- Military (–55°C to 125°C) temperature range
- Extended product life cycle
- Product traceability
- Meets NASAs ASTM E595 outgassing specification